一种大面积高性能交叉开关的电路设计

[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems Pub Date : 1991-11-18 DOI:10.1109/DFTVS.1991.199943

M. Patyra, Wojciech Maly

{"title":"一种大面积高性能交叉开关的电路设计","authors":"M. Patyra, Wojciech Maly","doi":"10.1109/DFTVS.1991.199943","DOIUrl":null,"url":null,"abstract":"The methodology for circuit design of large area ICs (LAICs) is discussed. The partitioning and layout strategies for a self-testing, self-reconfigurating LAIC are formulated. It is shown that by proper layout design the circuit sensitivity to the manufacturing defects can be drastically decreased. A LAIC crossbar switch chip, which served as a vehicle for the experimental verification of the described ideas, was designed, fabricated and successfully tested. The built-in current (BIC) sensor was used in the fabricated crossbar IC in order to perform self-testing and self-reconfiguration purposes.<<ETX>>","PeriodicalId":440536,"journal":{"name":"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Circuit design for a large area high-performance crossbar switch\",\"authors\":\"M. Patyra, Wojciech Maly\",\"doi\":\"10.1109/DFTVS.1991.199943\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The methodology for circuit design of large area ICs (LAICs) is discussed. The partitioning and layout strategies for a self-testing, self-reconfigurating LAIC are formulated. It is shown that by proper layout design the circuit sensitivity to the manufacturing defects can be drastically decreased. A LAIC crossbar switch chip, which served as a vehicle for the experimental verification of the described ideas, was designed, fabricated and successfully tested. The built-in current (BIC) sensor was used in the fabricated crossbar IC in order to perform self-testing and self-reconfiguration purposes.<<ETX>>\",\"PeriodicalId\":440536,\"journal\":{\"name\":\"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1991.199943\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1991.199943","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 11

摘要

讨论了大面积集成电路的电路设计方法。提出了自测试、自重构LAIC的分区和布局策略。结果表明，通过合理的布局设计，可以大大降低电路对制造缺陷的灵敏度。设计、制作并成功测试了一种LAIC交叉开关芯片，作为实验验证所述思想的载体。为了实现自测试和自重构的目的，将内置电流(BIC)传感器应用于制造的交叉棒集成电路中

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Circuit design for a large area high-performance crossbar switch

The methodology for circuit design of large area ICs (LAICs) is discussed. The partitioning and layout strategies for a self-testing, self-reconfigurating LAIC are formulated. It is shown that by proper layout design the circuit sensitivity to the manufacturing defects can be drastically decreased. A LAIC crossbar switch chip, which served as a vehicle for the experimental verification of the described ideas, was designed, fabricated and successfully tested. The built-in current (BIC) sensor was used in the fabricated crossbar IC in order to perform self-testing and self-reconfiguration purposes.<>

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来源期刊

[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems

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