BGA多次返工后高密度PCA的可靠性分析

J. Du
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引用次数: 2

摘要

在ATE行业中,一个高速、高密度的PCA通常集成多个BGA封装的IC组件。BGA组件的返工是一个复杂的过程,也会影响主成分分析的可靠性。因此,生产中的BGA返工限制始终是高密度pca的昂贵成本与返工后pca的可靠性之间的权衡。大多数行业将BGA返工限制在3次以内。在这项工作中,我们提出了18个BGA在单个PCA上的密集返工,研究了热回流对高纵横比PTH和微通孔的影响,并分析了返工后的焊点质量。横断面和染色-探针测试的成功结果证明了在单个高密度PCA上进行多个BGA重构的可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability Analysis for High-Density PCA After Multiple BGA Reworks
In ATE industry one high-speed, high-density PCA usually integrates multiple BGA packaged IC components. Reworking BGA components is a complicated process that also impacts PCA reliability. Therefore, the BGA rework limit in production is always a trade-off between the expensive costs of high-density PCAs and the reliabilities of PCAs after reworks. Most industries limit the BGA reworks to 3. In this work, we propose intensive 18 BGA reworks on single PCA, investigate thermal reflow effects on high aspect ratio PTH and micro-vias, and analyze solder joint qualities after reworks. The successful test results from cross-section and dye-and-pry demonstrate the reliabilities of such multiple BGA reworks on single high-density PCA.
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