32片并联的1.7kV SiC MOSFET模块内置栅极驱动器设计

Liyang Du, Yuxiang Chen, Xia Du, Haodong Yang, Hao Chen, H. Mantooth
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引用次数: 0

摘要

提高SiC MOSFET的电流性能是SiC应用的一个重要课题。模块化封装是一种应用广泛的解决方案,具有突出的功率密度和集成度优点。更多的芯片并联到一个模块中以提高功率密度,并在内部封装辅助电路,如栅极驱动器,以提高集成度。本文设计了一个内置栅极驱动器来驱动一个1.7kV/1.6kA、32片并联的SiC MOSFET模块。为了实现该模块所期望的特性,讨论了栅极驱动器的相应设计考虑。首先,按照设计流程计算出与驱动性能相关的参数。其次,讨论了传输线中的延迟效应,并建立了不同位置组装模组的栅极电压失配模型。采用差别化阈值电压策略安排和选择芯片以消除不匹配。最后,通过双脉冲测试实验验证了所提出的栅极驱动器和相应设计方法的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Build-in Gate Driver Design for 1.7kV SiC MOSFET Module with 32-chip Paralleled
Improving current capability of SiC MOSFET is an essential topic for SiC applications. Modular package is a widely applied solution with outstanding power density and integration merit. More dies are paralleled into one module to improve power density, and an auxiliary circuit, like a gate driver, is packaged inside to enhance integration. In this paper, a built-in gate driver is designed to drive a 1.7kV/1.6kA, 32-chip paralleled SiC MOSFET module. To realize the desired feature of the module, corresponding design considerations of the gate driver are discussed. Firstly, the parameters related to driving capability are figured out following a design procedure. Secondly, the delay effect in a transmission line is discussed, and a model is built to analyze the gate-to-source voltage mismatch among dies assembled at different positions. A differentiated threshold voltage strategy for arranging and selecting dies is applied to cancel mismatches. Finally, double pulse test experiments prove the feasibility of the proposed gate driver and corresponding design methods.
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