T. Ishii, Y. Watanabe, Y. Yano, S. Goka, T. Sato, H. Sekimoto
{"title":"具有温度变化功能的模态型形测量系统","authors":"T. Ishii, Y. Watanabe, Y. Yano, S. Goka, T. Sato, H. Sekimoto","doi":"10.1109/FREQ.2010.5556305","DOIUrl":null,"url":null,"abstract":"A measurement system with a temperature control function was developed for mapping the vibration patterns of piezoelectric resonator devices. This system is based on the laser speckle method with intermittent device excitation. By use of a small oven with transparent windows, the vibration shapes of devices can be visualized in high temperature environment. Experimental results using a 5.6 MHz AT-cut quartz resonator show that the mode shapes can be visualized from room temperature to 74°C","PeriodicalId":344989,"journal":{"name":"2010 IEEE International Frequency Control Symposium","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Mode shape measurement system with temperature variation function\",\"authors\":\"T. Ishii, Y. Watanabe, Y. Yano, S. Goka, T. Sato, H. Sekimoto\",\"doi\":\"10.1109/FREQ.2010.5556305\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A measurement system with a temperature control function was developed for mapping the vibration patterns of piezoelectric resonator devices. This system is based on the laser speckle method with intermittent device excitation. By use of a small oven with transparent windows, the vibration shapes of devices can be visualized in high temperature environment. Experimental results using a 5.6 MHz AT-cut quartz resonator show that the mode shapes can be visualized from room temperature to 74°C\",\"PeriodicalId\":344989,\"journal\":{\"name\":\"2010 IEEE International Frequency Control Symposium\",\"volume\":\"85 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Frequency Control Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.2010.5556305\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Frequency Control Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.2010.5556305","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Mode shape measurement system with temperature variation function
A measurement system with a temperature control function was developed for mapping the vibration patterns of piezoelectric resonator devices. This system is based on the laser speckle method with intermittent device excitation. By use of a small oven with transparent windows, the vibration shapes of devices can be visualized in high temperature environment. Experimental results using a 5.6 MHz AT-cut quartz resonator show that the mode shapes can be visualized from room temperature to 74°C
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