压印技术在高功率激光领域的应用

Haiyan Wang, Cheng Liu, X. Pan, Jianqiang Zhu
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引用次数: 2

摘要

常用的干涉仪和哈特曼-夏克传感器由于光学元件孔径大、相位梯度大、表面轮廓不规则等原因,不能很好地用于高功率激光领域的相位或波前测量。压型成像技术是一种新兴的短波相干衍射成像技术,由于其突出的优点,可以很好地替代传统技术。光学元件的复透射率可以用平面摄影法测量其透射场和入射场,并计算它们的相位差。由于压型测量可以实现与干涉测量相媲美的分辨率测量,因此在高功率激光领域有着广泛的应用,如测量大型光学元件的复杂透过率、气冷钕玻璃放大器的热畸变、透镜阵列的焦距等。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The application of ptychography in the field of high power laser
The commonly used interferometer and Hartmann-Shack sensor are not ideally qualified for the phase or wavefront measurement in the field of high power laser because the optical elements always have large aperture, the steep phase gradient and very irregular surface profile. The ptychography, which is a newly developed coherent diffraction method for the imaging with short wavelength, can be a perfect alternative to traditional technologies due to its outstanding advantages. The complex transmittance of the optical element can be obtained by measuring its transmitted and incident fields with ptychography and calculating their phase difference. Since ptychography can realize measurement with a resolution comparable to that of interferometry, it can find lots of applications in the field of high power laser such as the measurement of the complex transmittance of large optical element, the thermal distortion of the gas-cooled Nd:glass amplifier, and the focal length of the lens array etc.
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