RobuCheck:数字电路的鲁棒性检查器

2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools Pub Date : 2010-04-27 DOI:10.1145/1772630.1772641

Stefan Frehse, G. Fey, André Sülflow, R. Drechsler

{"title":"RobuCheck:数字电路的鲁棒性检查器","authors":"Stefan Frehse, G. Fey, André Sülflow, R. Drechsler","doi":"10.1145/1772630.1772641","DOIUrl":null,"url":null,"abstract":"Continuously shrinking feature sizes cause an increasing vulnerability of digital circuits. Manufacturing failures and transient faults may tamper the functionality. Automated support is required to analyze the fault tolerance of circuits. In this paper, Robu Check is presented - a design tool to analyze the fault tolerance of digital circuits. Engines based on simulation and formal methods are integrated to identify components that require additional fault protection. Consequently, an overall estimation of fault tolerance of the circuit is determined.","PeriodicalId":356885,"journal":{"name":"2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"RobuCheck: A Robustness Checker for Digital Circuits\",\"authors\":\"Stefan Frehse, G. Fey, André Sülflow, R. Drechsler\",\"doi\":\"10.1145/1772630.1772641\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Continuously shrinking feature sizes cause an increasing vulnerability of digital circuits. Manufacturing failures and transient faults may tamper the functionality. Automated support is required to analyze the fault tolerance of circuits. In this paper, Robu Check is presented - a design tool to analyze the fault tolerance of digital circuits. Engines based on simulation and formal methods are integrated to identify components that require additional fault protection. Consequently, an overall estimation of fault tolerance of the circuit is determined.\",\"PeriodicalId\":356885,\"journal\":{\"name\":\"2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1772630.1772641\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1772630.1772641","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

特征尺寸的不断缩小导致数字电路的脆弱性日益增加。制造故障和瞬态故障可能会干扰功能。分析电路的容错性需要自动化的支持。本文提出了一种分析数字电路容错性的设计工具——Robu Check。基于仿真和形式化方法的引擎集成在一起，以识别需要额外故障保护的组件。因此，确定了电路容错性的总体估计。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

RobuCheck: A Robustness Checker for Digital Circuits

Continuously shrinking feature sizes cause an increasing vulnerability of digital circuits. Manufacturing failures and transient faults may tamper the functionality. Automated support is required to analyze the fault tolerance of circuits. In this paper, Robu Check is presented - a design tool to analyze the fault tolerance of digital circuits. Engines based on simulation and formal methods are integrated to identify components that require additional fault protection. Consequently, an overall estimation of fault tolerance of the circuit is determined.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools

自引率

0.00%

发文量