实现部分覆盖技术表征导体背衬材料的电磁特性

2018 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium) Pub Date : 2018-07-01 DOI:10.1109/USNC-URSI.2018.8602558

E. Rothwell, Saranraj Karuppuswami, P. Chahal

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引用次数: 0

摘要

描述了一种用于测量导体背衬材料样品介电常数和磁导率的部分覆盖技术。误差分析表明，该方法的鲁棒性与双厚度法相当。实验结果将在会议上公布。

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Implementation of a Partial Overlay Technique for the Characterization of the Electromagnetic Properties of Conductor-Backed Materials

A partial overlay technique is described for measuring the permittivity and permeability of conductor-backed material samples. Error analysis shows that the method is nearly as robust as the two-thickness method. Experimental results will be presented at the conference.

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来源期刊

2018 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)

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