在InAs衬底上生长的高温中波长带间级联红外光电探测器

Yi Zhou, Jianxin Chen, Zhicheng Xu, Li He
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引用次数: 4

摘要

近年来,基于ii型超晶格的带间级联探测器(ICIP)在高温下显示出巨大的性能潜力。本文报道了首次在InAs衬底上生长的中红外带间级联光电探测器的研究。通过比较生长在InAs衬底上的三种探测器,研究了光生载流子在ICIP结构中的输运。该2级ICIP器件在室温下的量子效率高达20%左右。2级ICIP器件在-0.05V时的暗电流密度在80K时低至1 nA,在150K时低至1 mA,与目前具有类似截止波长的PIN超晶格光电探测器相当。约翰逊噪声限制D*达到1.64×1014cm。Hz1/2/W在3.65 μm和80K, 4.1×1010cm。Hz1/2/W在3.8 μm和200K。300 K的背景限制红外性能(BLIP)工作温度估计超过140 K。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High operation temperature mid-wavelength interband cascade infrared photodetectors grown on InAs substrate
In recent years, interband cascade detectors (ICIP) based on typer-II superlattice have shown great performance potential at high operation temperature. In this paper, we report our studies on mid-infrared interband cascade photodetectors first grown on InAs substrate. We examined the photo-generated carriers’ transport in ICIP structures by comparing three detectors grown on InAs substrate. The 2-stages ICIP device has demonstrated a high quantum efficiency around 20% at room temperature. The dark current density of the 2-stages ICIP device at -0.05V is as low as 1 nA at 80K, 1 mA at 150K, which is comparable to the state of art PIN superlattice photodetectors with similar cutoff wavelength. The Johnson-noise limited D* reaches 1.64×1014cm.Hz1/2/W at 3.65 μm and 80K, and 4.1×1010cm.Hz1/2/W at 3.8 μm and 200K. The 300 K background limited infrared performance (BLIP) operation temperature is estimated to be over 140 K.
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