收益率风险卡在D2

T. Agostino, V. Dhar, R. Dudonis, J. Ku
{"title":"收益率风险卡在D2","authors":"T. Agostino, V. Dhar, R. Dudonis, J. Ku","doi":"10.1109/ASMC.1996.558109","DOIUrl":null,"url":null,"abstract":"Uncommon events or out of the ordinary situations often trigger line yield losses such as misprocesses, miscommunications, or missed opportunities. D2 distributed bright red \"Yield Risk\" cards to the factory technicians to visually highlight material requiring special handling and tangibly draw attention to the unusual situation. The simplicity of the red cards coupled with the method used to proliferate the idea makes this system especially unique and transferable to other factories or situations where technician involvement is essential. This article documents and discusses results from the development and implementation of a visual tool, the Yield Risk card, used to enhance TMT yield effectiveness. The project was begun April 1, 1995, and continues today at D2 in response to high operations related line yield losses. The purpose of the project was to develop a tool that addressed line yield losses and received high levels of technician buy-in and, subsequently, high usage.","PeriodicalId":325204,"journal":{"name":"IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Yield risk cards at D2\",\"authors\":\"T. Agostino, V. Dhar, R. Dudonis, J. Ku\",\"doi\":\"10.1109/ASMC.1996.558109\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Uncommon events or out of the ordinary situations often trigger line yield losses such as misprocesses, miscommunications, or missed opportunities. D2 distributed bright red \\\"Yield Risk\\\" cards to the factory technicians to visually highlight material requiring special handling and tangibly draw attention to the unusual situation. The simplicity of the red cards coupled with the method used to proliferate the idea makes this system especially unique and transferable to other factories or situations where technician involvement is essential. This article documents and discusses results from the development and implementation of a visual tool, the Yield Risk card, used to enhance TMT yield effectiveness. The project was begun April 1, 1995, and continues today at D2 in response to high operations related line yield losses. The purpose of the project was to develop a tool that addressed line yield losses and received high levels of technician buy-in and, subsequently, high usage.\",\"PeriodicalId\":325204,\"journal\":{\"name\":\"IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.1996.558109\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.1996.558109","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

不寻常的事件或不寻常的情况通常会触发线路收益损失,例如处理不当、沟通不畅或错失机会。D2向工厂技术人员分发亮红色的“Yield Risk”卡片,以在视觉上突出需要特殊处理的物料,并有形地提请注意异常情况。红牌的简单性,加上用来传播这个想法的方法,使得这个系统特别独特,可以转移到其他工厂或技术人员参与的情况下。本文记录并讨论了用于提高TMT产量有效性的可视化工具——产量风险卡的开发和实施的结果。该项目于1995年4月1日开始,并在D2继续进行,以应对与生产线产量损失相关的高作业。该项目的目的是开发一种解决管线产量损失的工具,并获得高水平的技术支持,随后获得高使用率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Yield risk cards at D2
Uncommon events or out of the ordinary situations often trigger line yield losses such as misprocesses, miscommunications, or missed opportunities. D2 distributed bright red "Yield Risk" cards to the factory technicians to visually highlight material requiring special handling and tangibly draw attention to the unusual situation. The simplicity of the red cards coupled with the method used to proliferate the idea makes this system especially unique and transferable to other factories or situations where technician involvement is essential. This article documents and discusses results from the development and implementation of a visual tool, the Yield Risk card, used to enhance TMT yield effectiveness. The project was begun April 1, 1995, and continues today at D2 in response to high operations related line yield losses. The purpose of the project was to develop a tool that addressed line yield losses and received high levels of technician buy-in and, subsequently, high usage.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信