基于属性检查的LBIST，可提高可诊断性

2014 19th IEEE European Test Symposium (ETS) Pub Date : 2014-05-26 DOI:10.1109/ETS.2014.6847828

S. Prabhu, Vineeth V. Acharya, S. Bagri, M. Hsiao

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引用次数: 2

摘要

我们提出了一种新的基于属性检查的LBIST架构，它使用硬件监视器来检查输出响应中的某些属性。如果违反了任何属性，则存储失败的属性号以供诊断。所提出的体系结构以最小的硬件开销大大提高了可诊断性。实验结果表明，我们的架构所获得的诊断分辨率与许多电路在非bist设置中获得的诊断分辨率相当。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Property-checking based LBIST for improved diagnosability

We propose a new property-checking-based LBIST architecture which uses hardware monitors to check certain properties in the output responses. If any property is violated, the failing property number is stored for diagnosis. The proposed architecture improves diagnosability considerably with minimal hardware overhead. Experimental results show that the diagnostic resolution achieved by our architecture is comparable to that achieved in a non-BIST setup for many circuits.

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2014 19th IEEE European Test Symposium (ETS)

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