{"title":"保护继电器的低电平试验","authors":"C.F. Henville, B. Hydro, J. Mooney","doi":"10.1109/CCECE.1996.548255","DOIUrl":null,"url":null,"abstract":"Low level testing of protective relays is a relatively new option for users to check their performance with simplified test equipment. The option presents itself because of the low energy demands of modern solid-state relays, compared with the much higher energy requirements of older style electromechanical relays. This paper describes this low level testing technique (particularly with reference to digital relays), and discusses the advantages and disadvantages of the test method.","PeriodicalId":269440,"journal":{"name":"Proceedings of 1996 Canadian Conference on Electrical and Computer Engineering","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Low level testing for protective relays\",\"authors\":\"C.F. Henville, B. Hydro, J. Mooney\",\"doi\":\"10.1109/CCECE.1996.548255\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Low level testing of protective relays is a relatively new option for users to check their performance with simplified test equipment. The option presents itself because of the low energy demands of modern solid-state relays, compared with the much higher energy requirements of older style electromechanical relays. This paper describes this low level testing technique (particularly with reference to digital relays), and discusses the advantages and disadvantages of the test method.\",\"PeriodicalId\":269440,\"journal\":{\"name\":\"Proceedings of 1996 Canadian Conference on Electrical and Computer Engineering\",\"volume\":\"90 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1996 Canadian Conference on Electrical and Computer Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCECE.1996.548255\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1996 Canadian Conference on Electrical and Computer Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.1996.548255","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low level testing of protective relays is a relatively new option for users to check their performance with simplified test equipment. The option presents itself because of the low energy demands of modern solid-state relays, compared with the much higher energy requirements of older style electromechanical relays. This paper describes this low level testing technique (particularly with reference to digital relays), and discusses the advantages and disadvantages of the test method.
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