用于晶体光学材料无损表征的增强干涉测量技术:自动表达折射率测量

I. Karbovnyk, N. Andrushchak, Y. Bobitskii
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引用次数: 8

摘要

我们报告了一种增强的实验装置,可以快速准确地测定光学材料的折射率。该装置配有高精度的样品定位系统和灵敏的干涉条纹偏移配准探测器。此外,还讨论了一种可用于消除由非平行样本边缘引起的误差的方法。介绍了铌酸锂折射率的测量结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhanced interferometric technique for non-destructive characterization of crystalline optical materials: automated express refractive index measurements
We report an enhanced experimental set-up that allows fast and accurate determination of refractive indexes in optical materials. The set-up is equipped with the high-precision sample positioning system and sensitive detector for the registration of interference fringes shift. Additionally, an approach that can be utilized in order to eliminate the error caused by non-parallel sample edges is discussed. The results of the refraction index measurements in lithium niobate are presented.
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