在HL-LHC和未来的对撞机中实现高背景速率的μ子漂管室读出电子器件的优化

S. Nowak, S. Abovyan, P. Gadow, K. Ecker, D. Fink, M. Fras, O. Kortner, H. Kroha, F. Muller, R. Richter, C. Schmid, K. Schmidt-Sommerfeld, Y. Zhao
{"title":"在HL-LHC和未来的对撞机中实现高背景速率的μ子漂管室读出电子器件的优化","authors":"S. Nowak, S. Abovyan, P. Gadow, K. Ecker, D. Fink, M. Fras, O. Kortner, H. Kroha, F. Muller, R. Richter, C. Schmid, K. Schmidt-Sommerfeld, Y. Zhao","doi":"10.1109/NSSMIC.2015.7581815","DOIUrl":null,"url":null,"abstract":"In the ATLAS Muon Spectrometer, Monitored Drift Tube (MDT) chambers and sMDT chambers with half of the tube diameter of the MDTs are used for precision muon track reconstruction. The sMDT chambers are designed for operation at high counting rates due to neutron and gamma background irradiation expected for the HL-LHC and future hadron colliders. The existing MDT read-out electronics uses bipolar signal shaping which causes an undershoot of opposite polarity and same charge after a signal pulse. At high counting rates and short electronics dead time used for the sMDTs, signal pulses pile up on the undershoot of preceding background pulses leading to a reduction of the signal amplitude and a jitter in the drift time measurement and, therefore, to a degradation of drift tube efficiency and spatial resolution. In order to further increase the rate capability of sMDT tubes, baseline restoration can be used in the read-out electronics to suppress the pile-up effects. A discrete bipolar shaping circuit with baseline restoration has been developed and used for reading out sMDT tubes under irradiation with a 24 MBq 90 Sr source. The measurements results show a substantial improvement of the performance of the sMDT tubes at high counting rates.","PeriodicalId":106811,"journal":{"name":"2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Optimisation of the read-out electronics of muon drift-tube chambers for very high background rates at HL-LHC and future colliders\",\"authors\":\"S. Nowak, S. Abovyan, P. Gadow, K. Ecker, D. Fink, M. Fras, O. Kortner, H. Kroha, F. Muller, R. Richter, C. Schmid, K. Schmidt-Sommerfeld, Y. Zhao\",\"doi\":\"10.1109/NSSMIC.2015.7581815\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the ATLAS Muon Spectrometer, Monitored Drift Tube (MDT) chambers and sMDT chambers with half of the tube diameter of the MDTs are used for precision muon track reconstruction. The sMDT chambers are designed for operation at high counting rates due to neutron and gamma background irradiation expected for the HL-LHC and future hadron colliders. The existing MDT read-out electronics uses bipolar signal shaping which causes an undershoot of opposite polarity and same charge after a signal pulse. At high counting rates and short electronics dead time used for the sMDTs, signal pulses pile up on the undershoot of preceding background pulses leading to a reduction of the signal amplitude and a jitter in the drift time measurement and, therefore, to a degradation of drift tube efficiency and spatial resolution. In order to further increase the rate capability of sMDT tubes, baseline restoration can be used in the read-out electronics to suppress the pile-up effects. A discrete bipolar shaping circuit with baseline restoration has been developed and used for reading out sMDT tubes under irradiation with a 24 MBq 90 Sr source. The measurements results show a substantial improvement of the performance of the sMDT tubes at high counting rates.\",\"PeriodicalId\":106811,\"journal\":{\"name\":\"2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSSMIC.2015.7581815\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSSMIC.2015.7581815","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

在阿特拉斯μ子光谱仪中,采用监测漂移管(MDT)室和直径为MDT管径一半的sMDT室进行精确的μ子轨道重建。由于HL-LHC和未来的强子对撞机预计会受到中子和伽马背景辐射的影响,sMDT室的设计目的是在高计数率下运行。现有的MDT读出电子设备使用双极信号整形,在信号脉冲后产生相反极性和相同电荷的欠冲。在smdt使用的高计数率和短电子死区时间下,信号脉冲会堆积在之前背景脉冲的下突上,导致信号幅度减小和漂移时间测量中的抖动,从而导致漂移管效率和空间分辨率的下降。为了进一步提高sMDT管的速率能力,可以在读出电子器件中使用基线恢复来抑制堆积效应。开发了一种具有基线恢复的离散双极整形电路,并用于读取24 MBq 90sr源照射下的sMDT管。测量结果表明,在高计数率下,sMDT管的性能有了实质性的改善。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optimisation of the read-out electronics of muon drift-tube chambers for very high background rates at HL-LHC and future colliders
In the ATLAS Muon Spectrometer, Monitored Drift Tube (MDT) chambers and sMDT chambers with half of the tube diameter of the MDTs are used for precision muon track reconstruction. The sMDT chambers are designed for operation at high counting rates due to neutron and gamma background irradiation expected for the HL-LHC and future hadron colliders. The existing MDT read-out electronics uses bipolar signal shaping which causes an undershoot of opposite polarity and same charge after a signal pulse. At high counting rates and short electronics dead time used for the sMDTs, signal pulses pile up on the undershoot of preceding background pulses leading to a reduction of the signal amplitude and a jitter in the drift time measurement and, therefore, to a degradation of drift tube efficiency and spatial resolution. In order to further increase the rate capability of sMDT tubes, baseline restoration can be used in the read-out electronics to suppress the pile-up effects. A discrete bipolar shaping circuit with baseline restoration has been developed and used for reading out sMDT tubes under irradiation with a 24 MBq 90 Sr source. The measurements results show a substantial improvement of the performance of the sMDT tubes at high counting rates.
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