{"title":"V93000测试系统测试板设计研究","authors":"Zhirong He","doi":"10.1117/12.2680123","DOIUrl":null,"url":null,"abstract":"DUT board is an interface between the Device Under Test system for the IC test. This paper describes how to design a DUT board based on the test system’s configuration. To enhance the quality of performance on the DUT board, it also focuses on some methods of electrical design about layers distribution, trace routing, signal filtering for mixed-signal, high-speed signal, and special components for the V93000 test system.","PeriodicalId":201466,"journal":{"name":"Symposium on Advances in Electrical, Electronics and Computer Engineering","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Research on the design of DUT board for the V93000 test system\",\"authors\":\"Zhirong He\",\"doi\":\"10.1117/12.2680123\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"DUT board is an interface between the Device Under Test system for the IC test. This paper describes how to design a DUT board based on the test system’s configuration. To enhance the quality of performance on the DUT board, it also focuses on some methods of electrical design about layers distribution, trace routing, signal filtering for mixed-signal, high-speed signal, and special components for the V93000 test system.\",\"PeriodicalId\":201466,\"journal\":{\"name\":\"Symposium on Advances in Electrical, Electronics and Computer Engineering\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Symposium on Advances in Electrical, Electronics and Computer Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2680123\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Symposium on Advances in Electrical, Electronics and Computer Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2680123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Research on the design of DUT board for the V93000 test system
DUT board is an interface between the Device Under Test system for the IC test. This paper describes how to design a DUT board based on the test system’s configuration. To enhance the quality of performance on the DUT board, it also focuses on some methods of electrical design about layers distribution, trace routing, signal filtering for mixed-signal, high-speed signal, and special components for the V93000 test system.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
