Life assessment method of electronic components based on reliability factor sharing model

An important problem to be solved in reliability simulation of electronic components is to build component-level reliability models based on device-level evaluation results. When the structure or device information and connection composition information of electronic components are obtained, the reliability index information of single point failure can be calculated by device/structure failure model and distribution model. In this paper, a reliability factor sharing model is proposed to evaluate the lifetime of electronic components. For the general case that the components or structures of electronic components are subject to different failure distributions, the non-elementary mapping relationship between device failure distribution and electronic component failure can be established. Furthermore, an efficient and low-complexity method for solving the reliability life of electronic components is constructed by using numerical techniques.