{"title":"混合忆阻- mos异或与异或逻辑门的设计","authors":"Xiaoyan Xu, Xiaole Cui, M. Luo, Qiujun Lin, Yichi Luo, Yufeng Zhou","doi":"10.1109/EDSSC.2017.8126414","DOIUrl":null,"url":null,"abstract":"Two hybrid memristor-MOS exclusive OR (XOR) and exclusive NOR (XNOR) logic gates based on Memristor Ratioed Logic (MRL) are presented. The proposed gates present logic states with voltages, and implement the logic operation within one clock cycle. The designs ease the voltage degradation problem of the original MRL logic gates, while consuming fewer area overhead and less delay than their counterparts.","PeriodicalId":163598,"journal":{"name":"2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Design of hybrid memristor-MOS XOR and XNOR logic gates\",\"authors\":\"Xiaoyan Xu, Xiaole Cui, M. Luo, Qiujun Lin, Yichi Luo, Yufeng Zhou\",\"doi\":\"10.1109/EDSSC.2017.8126414\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Two hybrid memristor-MOS exclusive OR (XOR) and exclusive NOR (XNOR) logic gates based on Memristor Ratioed Logic (MRL) are presented. The proposed gates present logic states with voltages, and implement the logic operation within one clock cycle. The designs ease the voltage degradation problem of the original MRL logic gates, while consuming fewer area overhead and less delay than their counterparts.\",\"PeriodicalId\":163598,\"journal\":{\"name\":\"2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)\",\"volume\":\"89 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDSSC.2017.8126414\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDSSC.2017.8126414","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of hybrid memristor-MOS XOR and XNOR logic gates
Two hybrid memristor-MOS exclusive OR (XOR) and exclusive NOR (XNOR) logic gates based on Memristor Ratioed Logic (MRL) are presented. The proposed gates present logic states with voltages, and implement the logic operation within one clock cycle. The designs ease the voltage degradation problem of the original MRL logic gates, while consuming fewer area overhead and less delay than their counterparts.