{"title":"测量超宽带(UWB)设备“带外”干扰的生产测试方法","authors":"S. Bhattacharya, A. Chatterjee","doi":"10.1109/VTS.2005.67","DOIUrl":null,"url":null,"abstract":"The recent increase in demand within the wireless user community for short-range, very high rate data transmission (data, video) devices has spurred the growth of a new generation of 4G devices, viz. ultra-wideband (UWB). Due to its wide band of operation (3.1-10.6GHz) and non-conventional transmit/receive scheme (using short-duration, narrow baseband pulses), spectral power leakage to outside frequency bands causes interference with other wireless standards. In this paper, we focus on 'out-of-band' interference testing of UWB devices during production test. Due to stringent FCC spectrum regulations and very low power spectral density levels of the associated signals (-41.3dBm/MHz), production testing for interference is a big challenge and can incur significant test time, resulting in increased test cost. We propose a simple, low-cost test methodology for testing UWB devices. Simulation results are presented for a typical home environment. The channel model used can be easily modified and incorporated in any production test environment. Results show that using simple tests, estimates of 'out-of-band' interference can be obtained easily using the proposed test methodology.","PeriodicalId":268324,"journal":{"name":"23rd IEEE VLSI Test Symposium (VTS'05)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Production test methods for measuring 'out-of-band' interference of ultra wide band (UWB) devices\",\"authors\":\"S. Bhattacharya, A. Chatterjee\",\"doi\":\"10.1109/VTS.2005.67\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The recent increase in demand within the wireless user community for short-range, very high rate data transmission (data, video) devices has spurred the growth of a new generation of 4G devices, viz. ultra-wideband (UWB). Due to its wide band of operation (3.1-10.6GHz) and non-conventional transmit/receive scheme (using short-duration, narrow baseband pulses), spectral power leakage to outside frequency bands causes interference with other wireless standards. In this paper, we focus on 'out-of-band' interference testing of UWB devices during production test. Due to stringent FCC spectrum regulations and very low power spectral density levels of the associated signals (-41.3dBm/MHz), production testing for interference is a big challenge and can incur significant test time, resulting in increased test cost. We propose a simple, low-cost test methodology for testing UWB devices. Simulation results are presented for a typical home environment. The channel model used can be easily modified and incorporated in any production test environment. Results show that using simple tests, estimates of 'out-of-band' interference can be obtained easily using the proposed test methodology.\",\"PeriodicalId\":268324,\"journal\":{\"name\":\"23rd IEEE VLSI Test Symposium (VTS'05)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"23rd IEEE VLSI Test Symposium (VTS'05)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS.2005.67\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd IEEE VLSI Test Symposium (VTS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2005.67","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Production test methods for measuring 'out-of-band' interference of ultra wide band (UWB) devices
The recent increase in demand within the wireless user community for short-range, very high rate data transmission (data, video) devices has spurred the growth of a new generation of 4G devices, viz. ultra-wideband (UWB). Due to its wide band of operation (3.1-10.6GHz) and non-conventional transmit/receive scheme (using short-duration, narrow baseband pulses), spectral power leakage to outside frequency bands causes interference with other wireless standards. In this paper, we focus on 'out-of-band' interference testing of UWB devices during production test. Due to stringent FCC spectrum regulations and very low power spectral density levels of the associated signals (-41.3dBm/MHz), production testing for interference is a big challenge and can incur significant test time, resulting in increased test cost. We propose a simple, low-cost test methodology for testing UWB devices. Simulation results are presented for a typical home environment. The channel model used can be easily modified and incorporated in any production test environment. Results show that using simple tests, estimates of 'out-of-band' interference can be obtained easily using the proposed test methodology.