J. O'Mara, J. Ludwick, Nathaniel Hernandez, D. Walker, T. Back, M. Cahay, H. Hall
{"title":"介质衬底对金纳米级横向真空发射器件的影响","authors":"J. O'Mara, J. Ludwick, Nathaniel Hernandez, D. Walker, T. Back, M. Cahay, H. Hall","doi":"10.1109/IVNC57695.2023.10189015","DOIUrl":null,"url":null,"abstract":"Field emission (FE) characteristics of 2-terminal Au lateral nanoscale vacuum field emission devices with different dielectric substrates is reported in this work. Field orthodoxy is tested with the Murphy Good plot. Poole-Frenkel leakage is presented as a primary mechanism for emission at low voltages through the substrates with some reported burn-in effects removed with correct substrate choice. The results are significant in that the leakage effects can be difficult to discern from pure PE and are thus important to consider in future designs of these types of devices.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of Dielectric Substrate on Gold Nanoscale Lateral Vacuum Emission Devices\",\"authors\":\"J. O'Mara, J. Ludwick, Nathaniel Hernandez, D. Walker, T. Back, M. Cahay, H. Hall\",\"doi\":\"10.1109/IVNC57695.2023.10189015\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Field emission (FE) characteristics of 2-terminal Au lateral nanoscale vacuum field emission devices with different dielectric substrates is reported in this work. Field orthodoxy is tested with the Murphy Good plot. Poole-Frenkel leakage is presented as a primary mechanism for emission at low voltages through the substrates with some reported burn-in effects removed with correct substrate choice. The results are significant in that the leakage effects can be difficult to discern from pure PE and are thus important to consider in future designs of these types of devices.\",\"PeriodicalId\":346266,\"journal\":{\"name\":\"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC57695.2023.10189015\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC57695.2023.10189015","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effect of Dielectric Substrate on Gold Nanoscale Lateral Vacuum Emission Devices
Field emission (FE) characteristics of 2-terminal Au lateral nanoscale vacuum field emission devices with different dielectric substrates is reported in this work. Field orthodoxy is tested with the Murphy Good plot. Poole-Frenkel leakage is presented as a primary mechanism for emission at low voltages through the substrates with some reported burn-in effects removed with correct substrate choice. The results are significant in that the leakage effects can be difficult to discern from pure PE and are thus important to consider in future designs of these types of devices.
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