{"title":"压缩射频光电二极管中的相位噪声","authors":"D. Tulchinsky, K. Williams","doi":"10.1109/MWP.2004.1396893","DOIUrl":null,"url":null,"abstract":"Amplitude and residual phase noise measurements of RF photodiodes are examined. For 1 to 2 dB of space charge induced RF compression, RF amplitude noise is suppressed by upwards of 8 dB, while phase noise increases by upwards of 10 dB.","PeriodicalId":137956,"journal":{"name":"2004 IEEE International Topical Meeting on Microwave Photonics (IEEE Cat. No.04EX859)","volume":"107 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Phase noise in compressed RF photodiodes\",\"authors\":\"D. Tulchinsky, K. Williams\",\"doi\":\"10.1109/MWP.2004.1396893\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Amplitude and residual phase noise measurements of RF photodiodes are examined. For 1 to 2 dB of space charge induced RF compression, RF amplitude noise is suppressed by upwards of 8 dB, while phase noise increases by upwards of 10 dB.\",\"PeriodicalId\":137956,\"journal\":{\"name\":\"2004 IEEE International Topical Meeting on Microwave Photonics (IEEE Cat. No.04EX859)\",\"volume\":\"107 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 IEEE International Topical Meeting on Microwave Photonics (IEEE Cat. No.04EX859)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWP.2004.1396893\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEEE International Topical Meeting on Microwave Photonics (IEEE Cat. No.04EX859)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWP.2004.1396893","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Amplitude and residual phase noise measurements of RF photodiodes are examined. For 1 to 2 dB of space charge induced RF compression, RF amplitude noise is suppressed by upwards of 8 dB, while phase noise increases by upwards of 10 dB.