{"title":"用扫描屏法计算平面波导中的反射矩阵","authors":"I. L. Aleksandrova, N. Pleshchinskii","doi":"10.1109/MMET.2008.4580927","DOIUrl":null,"url":null,"abstract":"The possibility of calculation of coefficients of the reflection matrix partially describing inhomogeneous in the plane waveguide with metallic sides by bounded number of characteristics of the reflected field is studied. To receive the additional information it is proposed to use a thin conducting screen placed in front of the investigated heterogeneity.","PeriodicalId":141554,"journal":{"name":"2008 12th International Conference on Mathematical Methods in Electromagnetic Theory","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Calculation of the reflection matrix in the plane waveguide by scanning screen method\",\"authors\":\"I. L. Aleksandrova, N. Pleshchinskii\",\"doi\":\"10.1109/MMET.2008.4580927\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The possibility of calculation of coefficients of the reflection matrix partially describing inhomogeneous in the plane waveguide with metallic sides by bounded number of characteristics of the reflected field is studied. To receive the additional information it is proposed to use a thin conducting screen placed in front of the investigated heterogeneity.\",\"PeriodicalId\":141554,\"journal\":{\"name\":\"2008 12th International Conference on Mathematical Methods in Electromagnetic Theory\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 12th International Conference on Mathematical Methods in Electromagnetic Theory\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MMET.2008.4580927\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 12th International Conference on Mathematical Methods in Electromagnetic Theory","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MMET.2008.4580927","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Calculation of the reflection matrix in the plane waveguide by scanning screen method
The possibility of calculation of coefficients of the reflection matrix partially describing inhomogeneous in the plane waveguide with metallic sides by bounded number of characteristics of the reflected field is studied. To receive the additional information it is proposed to use a thin conducting screen placed in front of the investigated heterogeneity.