第四组中红外光子学

G. Reed, M. Nedeljkovic, J. Soler Penadés, C. Mitchell, A. Khokhar, C. Littlejohns, S. Stankovic, B. Troia, V. Passaro, L. Shen, N. Healy, A. Peacock, A. Ortega-Moñux, G. Wanguemert-Perez, Í. Molina-Fernández, P. Cheben, J. Ackert, A. Knights, D. Thomson, F. Gardes, G. Mashanovich
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引用次数: 0

摘要

硅和锗的透明度分别高达约8 μm和15 μm,因此在生化和环境传感、医学、天文学和通信方面具有广泛的应用[1]。由于二氧化硅的高吸收损耗,绝缘体上硅(SOI)只能使用高达4 μm的波长,因此必须使用替代材料平台来处理更长的波长。此外,为了充分利用SOI的透明度范围,需要使用400或500 nm厚的覆盖层,而不是最流行的220 nm平台[2]。在本文中,我们报告了创纪录的低损耗MIR SOI条波导和槽波导,以及游标赛道配置。如果能够将埋藏的氧化物去除,并将其替换为空气,则该平台的透明度可达8 μm。我们报告了一种基于单蚀刻悬浮硅波导的鲁棒设计。Chang等人[3]和Shen等人[4]已经证明了在λ=5.8 μm处Ge-on-Si波导的损耗为2.5-3.0 dB/cm。我们报告了Ge-on-Si的创纪录低损耗,并演示了这种波导中的全光调制。虽然硅在1.1 μm以上是透明的,但已经证明,如果通过离子注入产生中带隙态,它可以用作光电探测器。在本文中,我们证明了通过注入含有硼的SOI波导,可以将对Si的探测扩展到2.5 μm。最后,我们还报道了锗的电吸收和电折射的理论分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Group IV mid-IR photonics
Silicon and germanium are transparent up to approximately 8 μm and 15 μm, respectively, thus offering a range of applications in biochemical and environmental sensing, medicine, astronomy and communications [1]. Silicon-on-insulator (SOI), can be used only up to 4 μm due to the high absorption loss of silicon dioxide, and therefore alternative material platforms have to be utilized for longer wavelengths. Also, to fully exploit the transparency range of SOI, 400 or 500 nm thick overlayers need to be used rather than the most popular 220 nm platform [2]. In this paper we report record low loss MIR SOI strip and slot waveguides, as well as Vernier racetrack configurations. If the buried oxide can be removed and replaced with air, such a platform would be transparent up to 8 μm. We report a robust design based on single etch suspended Si waveguides. Ge-on-Si waveguides have already been demonstrated with losses of 2.5-3.0 dB/cm at λ=5.8 μm by Chang et. al [3] and Shen et. al [4]. We report a record low loss in Ge-on-Si and a demonstration of all optical modulation in such waveguides. Although Si is transparent beyond 1.1 μm, it has been demonstrated that it can be used as a photodetector if mid-bandgap states are created by ion implantation. In this paper we show that detection in Si can be extended to up to 2.5 μm by implantation of SOI waveguides with boron. Finally, we also report theoretical analysis of electroabsorption and electrorefraction in Ge.
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