{"title":"CMOS逆变器电源诱发抖动的可变性感知建模","authors":"V. Verma, J. N. Tripathi","doi":"10.1109/SPI57109.2023.10145544","DOIUrl":null,"url":null,"abstract":"This study discusses and introduces the impact of variability on power supply-induced jitter in integrated circuits. It presents an analytical approach to model timing uncertainty in the output response of CMOS inverters due to process variations as well as power supply noise. The proposed theory is verified with both simulation and measurement. The proposed approach is not only limited to jitter estimation but it can also be used to analyze the variability issues in CMOS circuits.","PeriodicalId":281134,"journal":{"name":"2023 IEEE 27th Workshop on Signal and Power Integrity (SPI)","volume":"630 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Variability-Aware Modeling of Supply Induced Jitter in CMOS Inverters\",\"authors\":\"V. Verma, J. N. Tripathi\",\"doi\":\"10.1109/SPI57109.2023.10145544\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This study discusses and introduces the impact of variability on power supply-induced jitter in integrated circuits. It presents an analytical approach to model timing uncertainty in the output response of CMOS inverters due to process variations as well as power supply noise. The proposed theory is verified with both simulation and measurement. The proposed approach is not only limited to jitter estimation but it can also be used to analyze the variability issues in CMOS circuits.\",\"PeriodicalId\":281134,\"journal\":{\"name\":\"2023 IEEE 27th Workshop on Signal and Power Integrity (SPI)\",\"volume\":\"630 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE 27th Workshop on Signal and Power Integrity (SPI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SPI57109.2023.10145544\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE 27th Workshop on Signal and Power Integrity (SPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI57109.2023.10145544","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Variability-Aware Modeling of Supply Induced Jitter in CMOS Inverters
This study discusses and introduces the impact of variability on power supply-induced jitter in integrated circuits. It presents an analytical approach to model timing uncertainty in the output response of CMOS inverters due to process variations as well as power supply noise. The proposed theory is verified with both simulation and measurement. The proposed approach is not only limited to jitter estimation but it can also be used to analyze the variability issues in CMOS circuits.
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