{"title":"多晶CuInSe/ sub2 /薄膜的先进x射线分析","authors":"H. Dittrich, R. Menner, H. Schock","doi":"10.1109/PVSC.1990.111728","DOIUrl":null,"url":null,"abstract":"Advanced X-ray powder diffraction (XRD) analysis of polycrystalline semiconductor thin-films such as CuInSe/sub 2/ is able to give detailed information of the thin-film structure. A","PeriodicalId":211778,"journal":{"name":"IEEE Conference on Photovoltaic Specialists","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Advanced X-ray analysis of polycrystalline CuInSe/sub 2/ thin films\",\"authors\":\"H. Dittrich, R. Menner, H. Schock\",\"doi\":\"10.1109/PVSC.1990.111728\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Advanced X-ray powder diffraction (XRD) analysis of polycrystalline semiconductor thin-films such as CuInSe/sub 2/ is able to give detailed information of the thin-film structure. A\",\"PeriodicalId\":211778,\"journal\":{\"name\":\"IEEE Conference on Photovoltaic Specialists\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Conference on Photovoltaic Specialists\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.1990.111728\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Conference on Photovoltaic Specialists","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.1990.111728","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Advanced X-ray analysis of polycrystalline CuInSe/sub 2/ thin films
Advanced X-ray powder diffraction (XRD) analysis of polycrystalline semiconductor thin-films such as CuInSe/sub 2/ is able to give detailed information of the thin-film structure. A
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