电可编程保险丝(eFUSE):从记忆冗余到自主芯片

2007 IEEE Custom Integrated Circuits Conference Pub Date : 2007-09-01 DOI:10.1109/CICC.2007.4405850

N. Robson, J. Safran, C. Kothandaraman, A. Cestero, Xiang Chen, R. Rajeevakumar, A. Leslie, D. Moy, T. Kirihata, S. Iyer

{"title":"电可编程保险丝(eFUSE):从记忆冗余到自主芯片","authors":"N. Robson, J. Safran, C. Kothandaraman, A. Cestero, Xiang Chen, R. Rajeevakumar, A. Leslie, D. Moy, T. Kirihata, S. Iyer","doi":"10.1109/CICC.2007.4405850","DOIUrl":null,"url":null,"abstract":"Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide some insight into future uses in 32 nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future.","PeriodicalId":130106,"journal":{"name":"2007 IEEE Custom Integrated Circuits Conference","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"71","resultStr":"{\"title\":\"Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips\",\"authors\":\"N. Robson, J. Safran, C. Kothandaraman, A. Cestero, Xiang Chen, R. Rajeevakumar, A. Leslie, D. Moy, T. Kirihata, S. Iyer\",\"doi\":\"10.1109/CICC.2007.4405850\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide some insight into future uses in 32 nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future.\",\"PeriodicalId\":130106,\"journal\":{\"name\":\"2007 IEEE Custom Integrated Circuits Conference\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"71\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Custom Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2007.4405850\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2007.4405850","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 71

摘要

电保险丝(eFUSE)已成为实现内存冗余、芯片识别和认证、模拟设备修剪和其他应用的流行选择。我们将回顾IBM在180nm到45nm技术上的电保险丝解决方案的发展和应用，并对32nm技术的未来应用提供一些见解，并将eFUSE作为未来自主芯片的基石。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips

Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide some insight into future uses in 32 nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2007 IEEE Custom Integrated Circuits Conference

自引率

0.00%

发文量