{"title":"无数据的电子电路诊断","authors":"Varun Khemani, M. Azarian, M. Pecht","doi":"10.1109/ICPHM.2019.8819424","DOIUrl":null,"url":null,"abstract":"Operational data from the target system is widely considered a pre-requisite for implementation of PHM, as it used as training data. Often this data is not available to PHM practitioners because health monitoring capabilities may not be installed in legacy systems. This research presents an approach in which fault diagnosis can be implemented without any operational data and is generic enough to be applied to any electronic circuit provided a simulation model of the system with acceptable fidelity can be developed. The research also employs the Space-Filling Design, which can be used to generate the training data in a systematic, statistically valid framework, and is especially valuable for complex circuit with a large number of components. This design provides sufficient coverage of the parametric design space to be representative of the unavailable operational data, as well as incorporating the effects of parameter interaction on the simulated response of the system. Most PHM studies in the literature ignore the effect of the degradation of interacting components. We show, how such an assumption can lead to incorrect fault diagnosis/RUL estimation and propose methods to screen for two-way and higher order interactions. Finally, we use various deep learning approaches to diagnose circuit faults. This simulation-based fusion approach is a holistic framework for all types of analog electronic circuits.","PeriodicalId":113460,"journal":{"name":"2019 IEEE International Conference on Prognostics and Health Management (ICPHM)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Electronic Circuit Diagnosis with No Data\",\"authors\":\"Varun Khemani, M. Azarian, M. Pecht\",\"doi\":\"10.1109/ICPHM.2019.8819424\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Operational data from the target system is widely considered a pre-requisite for implementation of PHM, as it used as training data. Often this data is not available to PHM practitioners because health monitoring capabilities may not be installed in legacy systems. This research presents an approach in which fault diagnosis can be implemented without any operational data and is generic enough to be applied to any electronic circuit provided a simulation model of the system with acceptable fidelity can be developed. The research also employs the Space-Filling Design, which can be used to generate the training data in a systematic, statistically valid framework, and is especially valuable for complex circuit with a large number of components. This design provides sufficient coverage of the parametric design space to be representative of the unavailable operational data, as well as incorporating the effects of parameter interaction on the simulated response of the system. Most PHM studies in the literature ignore the effect of the degradation of interacting components. We show, how such an assumption can lead to incorrect fault diagnosis/RUL estimation and propose methods to screen for two-way and higher order interactions. Finally, we use various deep learning approaches to diagnose circuit faults. This simulation-based fusion approach is a holistic framework for all types of analog electronic circuits.\",\"PeriodicalId\":113460,\"journal\":{\"name\":\"2019 IEEE International Conference on Prognostics and Health Management (ICPHM)\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Conference on Prognostics and Health Management (ICPHM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICPHM.2019.8819424\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Conference on Prognostics and Health Management (ICPHM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPHM.2019.8819424","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Operational data from the target system is widely considered a pre-requisite for implementation of PHM, as it used as training data. Often this data is not available to PHM practitioners because health monitoring capabilities may not be installed in legacy systems. This research presents an approach in which fault diagnosis can be implemented without any operational data and is generic enough to be applied to any electronic circuit provided a simulation model of the system with acceptable fidelity can be developed. The research also employs the Space-Filling Design, which can be used to generate the training data in a systematic, statistically valid framework, and is especially valuable for complex circuit with a large number of components. This design provides sufficient coverage of the parametric design space to be representative of the unavailable operational data, as well as incorporating the effects of parameter interaction on the simulated response of the system. Most PHM studies in the literature ignore the effect of the degradation of interacting components. We show, how such an assumption can lead to incorrect fault diagnosis/RUL estimation and propose methods to screen for two-way and higher order interactions. Finally, we use various deep learning approaches to diagnose circuit faults. This simulation-based fusion approach is a holistic framework for all types of analog electronic circuits.