{"title":"SETmap:一种用于FPGA低功耗设计的软容错映射算法","authors":"Chi-Chen Peng, Chen Dong, Deming Chen","doi":"10.1109/ASPDAC.2011.5722219","DOIUrl":null,"url":null,"abstract":"Field programmable gate arrays (FPGAs) are widely used in VLSI applications due to their flexibility to implement logical functions, fast total turn-around time and low none-recurring engineering cost. SRAM-based FPGAs are the most popular FPGAs in the market. However, as process technologies advance to nanometer-scale regime, the issue of reliability of devices becomes critical. Soft errors are increasingly becoming a reliability concern because of the shrinking process dimensions. In this paper we study the technology mapping problem for FPGA circuits to reduce the occurrence of soft errors under the chip performance constraint and power reduction. Compared to two power-optimization mapping algorithms, SVmap [17] and Emap [15] respectively, we reduce the soft error rate by 40.6% with a 2.22% power overhead and 48.0% with a 2.18% power overhead using 6-LUTs.","PeriodicalId":316253,"journal":{"name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"SETmap: A soft error tolerant mapping algorithm for FPGA designs with low power\",\"authors\":\"Chi-Chen Peng, Chen Dong, Deming Chen\",\"doi\":\"10.1109/ASPDAC.2011.5722219\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Field programmable gate arrays (FPGAs) are widely used in VLSI applications due to their flexibility to implement logical functions, fast total turn-around time and low none-recurring engineering cost. SRAM-based FPGAs are the most popular FPGAs in the market. However, as process technologies advance to nanometer-scale regime, the issue of reliability of devices becomes critical. Soft errors are increasingly becoming a reliability concern because of the shrinking process dimensions. In this paper we study the technology mapping problem for FPGA circuits to reduce the occurrence of soft errors under the chip performance constraint and power reduction. Compared to two power-optimization mapping algorithms, SVmap [17] and Emap [15] respectively, we reduce the soft error rate by 40.6% with a 2.22% power overhead and 48.0% with a 2.18% power overhead using 6-LUTs.\",\"PeriodicalId\":316253,\"journal\":{\"name\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.2011.5722219\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2011.5722219","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SETmap: A soft error tolerant mapping algorithm for FPGA designs with low power
Field programmable gate arrays (FPGAs) are widely used in VLSI applications due to their flexibility to implement logical functions, fast total turn-around time and low none-recurring engineering cost. SRAM-based FPGAs are the most popular FPGAs in the market. However, as process technologies advance to nanometer-scale regime, the issue of reliability of devices becomes critical. Soft errors are increasingly becoming a reliability concern because of the shrinking process dimensions. In this paper we study the technology mapping problem for FPGA circuits to reduce the occurrence of soft errors under the chip performance constraint and power reduction. Compared to two power-optimization mapping algorithms, SVmap [17] and Emap [15] respectively, we reduce the soft error rate by 40.6% with a 2.22% power overhead and 48.0% with a 2.18% power overhead using 6-LUTs.