{"title":"关于电子设备对大功率电磁脉冲抗扰度的评估","authors":"Y. Parfenov, B. Titov, L. Zdoukhov, W. Radasky","doi":"10.1109/CEEM.2015.7368616","DOIUrl":null,"url":null,"abstract":"We have considered some shortcomings of the standard way of the assessment of electronic device immunity to high power EMPs. And we offer a way, which is based on the use of key parameters of pulse electric disturbances induced in circuits of equipment. This way allows assessing the dependence of results of testing electronic devices from the degree of conformity of EMPs in test volumes of simulators to typical EMPs, but also from degree of conformity of EMPs formed by simulators to real EMPs.","PeriodicalId":442379,"journal":{"name":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"About the assessment of electronic device immunity to high power electromagnetic pulses\",\"authors\":\"Y. Parfenov, B. Titov, L. Zdoukhov, W. Radasky\",\"doi\":\"10.1109/CEEM.2015.7368616\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have considered some shortcomings of the standard way of the assessment of electronic device immunity to high power EMPs. And we offer a way, which is based on the use of key parameters of pulse electric disturbances induced in circuits of equipment. This way allows assessing the dependence of results of testing electronic devices from the degree of conformity of EMPs in test volumes of simulators to typical EMPs, but also from degree of conformity of EMPs formed by simulators to real EMPs.\",\"PeriodicalId\":442379,\"journal\":{\"name\":\"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEEM.2015.7368616\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 7th Asia-Pacific Conference on Environmental Electromagnetics (CEEM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEEM.2015.7368616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
About the assessment of electronic device immunity to high power electromagnetic pulses
We have considered some shortcomings of the standard way of the assessment of electronic device immunity to high power EMPs. And we offer a way, which is based on the use of key parameters of pulse electric disturbances induced in circuits of equipment. This way allows assessing the dependence of results of testing electronic devices from the degree of conformity of EMPs in test volumes of simulators to typical EMPs, but also from degree of conformity of EMPs formed by simulators to real EMPs.
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