{"title":"非易失性存储器的汽车要求。鉴定的整体方法","authors":"V. Kottler","doi":"10.1109/IEDM.2016.7838396","DOIUrl":null,"url":null,"abstract":"This work describes a holistic approach to the application of the Robustness Validation methodology to the qualification of non-volatile memories (NVM) for automotive applications, as well as the resulting requirements to the NVM supplier and to the NVM design and technology.","PeriodicalId":186544,"journal":{"name":"2016 IEEE International Electron Devices Meeting (IEDM)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Automotive requirements to non-volatile memories — A holistic approach to qualification\",\"authors\":\"V. Kottler\",\"doi\":\"10.1109/IEDM.2016.7838396\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work describes a holistic approach to the application of the Robustness Validation methodology to the qualification of non-volatile memories (NVM) for automotive applications, as well as the resulting requirements to the NVM supplier and to the NVM design and technology.\",\"PeriodicalId\":186544,\"journal\":{\"name\":\"2016 IEEE International Electron Devices Meeting (IEDM)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Electron Devices Meeting (IEDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2016.7838396\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2016.7838396","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automotive requirements to non-volatile memories — A holistic approach to qualification
This work describes a holistic approach to the application of the Robustness Validation methodology to the qualification of non-volatile memories (NVM) for automotive applications, as well as the resulting requirements to the NVM supplier and to the NVM design and technology.
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