仪器仪表对测试薄片的影响

Shawn Rasheed, Jens Dietrich, Amjed Tahir
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引用次数: 1

摘要

测试碎片是一个影响测试和依赖于它的过程的问题。有几个因素导致或影响测试结果的不稳定。测试执行顺序、随机性和并发性是一些更常见且研究得很充分的原因。一些研究提到代码插装是导致或影响测试不稳定的一个因素。然而,这一问题的证据很少。在这项研究中,我们试图系统地收集仪器对测试碎片的影响的证据。我们对Java程序的常见插装类型进行了试验——即应用程序性能监视、覆盖和分析插装。然后,我们研究了仪器对一组9个程序的影响,这些程序来自一个用于研究测试脆弱性的现有数据集,由用Java编写的流行GitHub项目组成。我们观察到,在现实世界中,插装会导致程序出现漏洞。然而,这种效果是罕见的。我们还讨论了一个相关的问题-仪器仪表如何干扰薄片的检测和预防。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the Effect of Instrumentation on Test Flakiness
Test flakiness is a problem that affects testing and processes that rely on it. Several factors cause or influence the flakiness of test outcomes. Test execution order, randomness and concurrency are some of the more common and well-studied causes. Some studies mention code instrumentation as a factor that causes or affects test flakiness. However, evidence for this issue is scarce. In this study, we attempt to systematically collect evidence for the effects of instrumentation on test flakiness. We experiment with common types of instrumentation for Java programs—namely, application performance monitoring, coverage and profiling instrumentation. We then study the effects of instrumentation on a set of nine programs obtained from an existing dataset used to study test flakiness, consisting of popular GitHub projects written in Java. We observe cases where realworld instrumentation causes flakiness in a program. However, this effect is rare. We also discuss a related issue—how instrumentation may interfere with flakiness detection and prevention.
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