采用位线电荷回收和非均匀单元结构的新型低功耗64kb SRAM

Xu Wang, Jianfei Jiang, Zhigang Mao, Bingjing Ge, Xing-long Zhao
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引用次数: 1

摘要

对于传统的SRAM,位线消耗了最大的功耗,因为它们是具有寄生电容的长线。此外,比特行在写周期中比在读周期中消耗更多的功率。为了降低位线功耗,提出了一种新的电荷回收方法。所提出的SRAM分别将位线预充到VDD或GND,它们在写周期中共享相邻位线的电荷。这与以前的电荷回收技术不同,因为它不需要额外的电压供应,除了VDD。SRAM电池在非活动循环中也消耗了大量的泄漏功耗。所提出的SRAM采用非均匀单元方法来减少栅极泄漏。本文采用100nm CMOS技术实现了64kb (4k∗16bits) 1端口SRAM,仿真结果表明,在非活动模式下,SRAM单元的泄漏降低了32.9%,总功耗比传统SRAM降低了22%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel low power 64-kb SRAM using bit-lines charge-recycling and non-uniform cell scheme
For a conventional SRAM, bit-lines dissipate the largest part of power consumption, since they are long lines with parasitical capacitance. Furthermore, the bit-lines consume more power in write cycle than in read cycle. A new charge-recycling method is proposed to reduce bit-line power consumption. The proposed SRAM pre-charge the bit-lines to VDD or GND respectively, they share the charge of adjacent bit-lines in write cycle. This is different from the former charge-recycling technique, because it does not need the additional voltage supply except VDD. SRAM cells also dissipate a lot of leakage power consumption in inactive cycle. The proposed SRAM uses non uniform cell method to reduce gate leakage. In this paper, a 64kb (4k∗16bits) 1-port SRAM is implemented with 100nm CMOS technology, the simulation results show that it reduces 32.9% leakage for SRAM cell in inactive mode, and 22% total power consumption to the conventional SRAM.
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