{"title":"采用位线电荷回收和非均匀单元结构的新型低功耗64kb SRAM","authors":"Xu Wang, Jianfei Jiang, Zhigang Mao, Bingjing Ge, Xing-long Zhao","doi":"10.1109/ICECS.2011.6122329","DOIUrl":null,"url":null,"abstract":"For a conventional SRAM, bit-lines dissipate the largest part of power consumption, since they are long lines with parasitical capacitance. Furthermore, the bit-lines consume more power in write cycle than in read cycle. A new charge-recycling method is proposed to reduce bit-line power consumption. The proposed SRAM pre-charge the bit-lines to VDD or GND respectively, they share the charge of adjacent bit-lines in write cycle. This is different from the former charge-recycling technique, because it does not need the additional voltage supply except VDD. SRAM cells also dissipate a lot of leakage power consumption in inactive cycle. The proposed SRAM uses non uniform cell method to reduce gate leakage. In this paper, a 64kb (4k∗16bits) 1-port SRAM is implemented with 100nm CMOS technology, the simulation results show that it reduces 32.9% leakage for SRAM cell in inactive mode, and 22% total power consumption to the conventional SRAM.","PeriodicalId":251525,"journal":{"name":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A novel low power 64-kb SRAM using bit-lines charge-recycling and non-uniform cell scheme\",\"authors\":\"Xu Wang, Jianfei Jiang, Zhigang Mao, Bingjing Ge, Xing-long Zhao\",\"doi\":\"10.1109/ICECS.2011.6122329\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For a conventional SRAM, bit-lines dissipate the largest part of power consumption, since they are long lines with parasitical capacitance. Furthermore, the bit-lines consume more power in write cycle than in read cycle. A new charge-recycling method is proposed to reduce bit-line power consumption. The proposed SRAM pre-charge the bit-lines to VDD or GND respectively, they share the charge of adjacent bit-lines in write cycle. This is different from the former charge-recycling technique, because it does not need the additional voltage supply except VDD. SRAM cells also dissipate a lot of leakage power consumption in inactive cycle. The proposed SRAM uses non uniform cell method to reduce gate leakage. In this paper, a 64kb (4k∗16bits) 1-port SRAM is implemented with 100nm CMOS technology, the simulation results show that it reduces 32.9% leakage for SRAM cell in inactive mode, and 22% total power consumption to the conventional SRAM.\",\"PeriodicalId\":251525,\"journal\":{\"name\":\"2011 18th IEEE International Conference on Electronics, Circuits, and Systems\",\"volume\":\"121 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 18th IEEE International Conference on Electronics, Circuits, and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECS.2011.6122329\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2011.6122329","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel low power 64-kb SRAM using bit-lines charge-recycling and non-uniform cell scheme
For a conventional SRAM, bit-lines dissipate the largest part of power consumption, since they are long lines with parasitical capacitance. Furthermore, the bit-lines consume more power in write cycle than in read cycle. A new charge-recycling method is proposed to reduce bit-line power consumption. The proposed SRAM pre-charge the bit-lines to VDD or GND respectively, they share the charge of adjacent bit-lines in write cycle. This is different from the former charge-recycling technique, because it does not need the additional voltage supply except VDD. SRAM cells also dissipate a lot of leakage power consumption in inactive cycle. The proposed SRAM uses non uniform cell method to reduce gate leakage. In this paper, a 64kb (4k∗16bits) 1-port SRAM is implemented with 100nm CMOS technology, the simulation results show that it reduces 32.9% leakage for SRAM cell in inactive mode, and 22% total power consumption to the conventional SRAM.