改进用于访问软件系统和离散设备测试完整性的统计方法

B. Basok, A. A. Grechin
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引用次数: 0

摘要

本文介绍了一种测试完整性验证的统计方法。该方法基于对引入缺陷的离散器件的程序和数学模型的分析。论文中提出,该方法一方面通过引入多个缺陷,另一方面通过使用对被测对象及其单个组件执行的测试分析的结果,大大减少了评估测试所需的时间。文中给出了实验数据,验证了所提方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On improving the statistical method used to access the completeness of tests for software systems and discrete devices
This paper describes a statistical method for test completeness verification. The method is based on analyzing programs and mathematical models of discrete devices with introduced defects. It is proposed in the paper that the method allows largely reducing the time it takes to evaluate the tests by introducing multiple defects on the one hand, and, by using the results of the analysis of tests performed against the object under test and its individual components, on the other hand. The paper provides experimental data confirming the effectiveness of the proposed approaches.
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