Test Generation of Optical Logic Circuit Based on Binary Decision Diagram

With the breakthrough of silicon optical devices, optical network on chip has become a research hotspot. Optical logic circuit is the key unit that constitutes computing node in optical network on chip. Microring resonators (MRRs) are the basic components in optical logic circuits. However, due to the sensitivity of MRR to process drift and temperature, it is extremely prone to be faulty. Therefore, how to detect the optical logic circuit fault caused by MRRs is the key problem to improve its reliability. Firstly, the Binary Decision Diagram (BDD) of the fault-free and faulty circuit are established respectively; and then the BDD of the corresponding faulty circuit is constructed. The test BDD is obtained by XOR operation and simplification of the above two BDDs. The experimental results show the effectiveness of the proposed test generation based on BDD.