{"title":"多壁碳纳米管相干散射场发射显微图像的研究","authors":"P. Wu, S. Deng, Jun Chen, J. She, N. Xu","doi":"10.1109/IVNC.2004.1354914","DOIUrl":null,"url":null,"abstract":"In this paper, the field emission images of multiwalled carbon nanotubes (MWCNTs) was studied using field emission microscopy (FEM). The formation of observed images by electron diffraction theory was also explained in this study.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Study of field emission microscopic images originated from coherent scattering of multiwalled carbon nanotubes\",\"authors\":\"P. Wu, S. Deng, Jun Chen, J. She, N. Xu\",\"doi\":\"10.1109/IVNC.2004.1354914\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the field emission images of multiwalled carbon nanotubes (MWCNTs) was studied using field emission microscopy (FEM). The formation of observed images by electron diffraction theory was also explained in this study.\",\"PeriodicalId\":137345,\"journal\":{\"name\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2004.1354914\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2004.1354914","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Study of field emission microscopic images originated from coherent scattering of multiwalled carbon nanotubes
In this paper, the field emission images of multiwalled carbon nanotubes (MWCNTs) was studied using field emission microscopy (FEM). The formation of observed images by electron diffraction theory was also explained in this study.