电介质分析对环氧树脂固化的在线监测

Erick Franieck, M. Fleischmann, O. Hölck, M. Schneider-Ramelow
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摘要

在过去的几年中,环氧树脂成型化合物(EMCs)由于其良好的机械和耐化学性以及电绝缘性能,在电气化领域作为包装材料变得越来越重要。即将到来的趋势,如碳化硅和陶瓷的使用,正在加速发展,并在耐高温和稳定性方面对封装材料提出了新的要求。这里的重点是具有高玻璃化转变温度的环氧树脂成型化合物,由于电子元件的制造条件有限,必须在其最高玻璃化转变温度以下固化。因此,建立理想的固化工艺以达到预期的材料性能是一个相当大的挑战,因此,研究与工艺相关的条件下的固化行为是实现预期材料性能的关键因素。介电分析(DEA)是一种功能强大的测量技术,非常适合于电子元件直接封装领域的电磁兼容固化现场监测。然而,它有一个主要的缺点。DEA具有系统的温度依赖性,这阻碍了固化状态的确定,因为它通常是从标准的离线测量技术(如热机械分析(TMA)或动态扫描量热法(DSC)中知道的。在这项工作中,我们提出了一种经验方法,如何补偿电介质分析(DEA)对市售高玻璃化转变温度(Tg)(更高$200^{\circ}\ mathm {C})$ EMC的温度影响。考虑到电子封装技术的未来趋势,这种建议的规范化方法允许在近工艺条件下获得有关EMC固化状态的信息,这已经是一个很大的优势。此外,它还为如何扩大DEA的应用开辟了新的可能性,例如动力学固化表征。详细的材料特性和理解还可以在成本和开发方面实现制造优化,例如周期时间优化和更短的开发时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Inline cure monitoring of epoxy resin by dielectric analysis
In the past years, epoxy resin molding compounds (EMCs) have gained in importance as packaging material in the field of electrification due to their very good mechanical and chemical resistance and electrical insulation properties. Forthcoming trends, such as the use of silicon carbide and ceramics, are accelerating developments and are leading to new requirements for encapsulation materials in terms of high temperature resistance and stability. A focus here is on epoxy resin molding compounds with high glass transition temperatures, which as a consequence of the limited manufacturing conditions of electronic components must be cured below their maximum glass transition temperature. As a result, setting-up the ideal curing process to achieve the desired material properties poses quite a challenge, making therefore the study of the cure behavior under process-related conditions a key factor to achieve the desired material properties. The dielectric analysis (DEA) is a powerful measurement technique well suited for in-situ monitoring of EMC curing in the field of direct packaging of electronic parts. However, it possesses one major drawback. The DEA has a systematic temperature dependence that hinders the determination of the cure state as it is usually known from standard offline measurement techniques such as thermomechanical analysis (TMA), or dynamic-scanning-calorimetry (DSC). In this work we present an empirical approach how to compensate the temperature influence of the dielectric analysis (DEA) for a commercially available high glass transition temperature (Tg) (higher $200^{\circ}\mathrm{C})$ EMC. This proposed normalization method allows to gain information about the cure state of an EMC under near process conditions what would already be a great advantage considering the future trends in electronic packaging technology. In addition, it opens new possibilities on how to expand the application of the DEA, e.g. kinetic cure characterization. The detailed material characterization and understanding can also lead to manufacturing optimization in terms of cost and development such as cycle times optimization and shorter development times.
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