基于响应面法的充铜层合微孔热疲劳寿命研究

Xiaoxiao Li, Yufeng Sun, Guangyan Zhao
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引用次数: 0

摘要

HDI板的充铜层合微孔是金属导电层之间电互连的结构基础,其质量决定了HDI板的可靠性。由于技术的限制,在微孔中不可避免的存在微孔洞导致应力集中,这将大大降低微孔的热疲劳寿命。为了研究带微孔的微孔寿命模型,分析了层状微孔中微孔的不同特征参数和HDI板的设计参数。以最常见的商用HDI板[3+6+3]为例,基于Box-Behnken实验设计原理,建立了以微孔应变为响应的连续变表面模型。该模型可以考虑HDI设计和板验收过程中多个变量的影响。该方法可以评估影响微孔寿命的多种因素及其相互作用,提高设计的效率和可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thermal Fatigue Life of Copper-Filled Laminated Micropore Based on Response Surface Methodology
The copper-filled laminated micropore of the HDI board is the structural basis for the electrical interconnection between the conductive layers of the metal, and its quality determines the reliability of the HDI board. Due to the limitation of technology, it is unavoidable that there are microvoids in the micropore to cause stress concentration, which will greatly reduce the thermal fatigue life of the micropore. In order to study the life model of micropore with microvoid, the different characteristic parameters of microvoid in laminated micropore and the design parameters of HDI board were analyzed in this paper. Taking [3+6+3] the most common commercial HDI board as an example, based on the Box-Behnken experimental design principle, a continuous variable surface model with microporous strain as the response was established. The model can consider the influence of multiple variables in the process of HDI design and board acceptance. It can evaluate multiple factors affecting the micropore life and their interaction, and improve the efficiency and reliability of the design.
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