Carafe: CMOS VLSI电路的电感故障分析工具

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI:10.1109/VTEST.1993.313302

Santa Cruz, Alvin Lun-Knep, Jee, F. Ferguson, Kevin Karplus, T. Larrabee

{"title":"Carafe: CMOS VLSI电路的电感故障分析工具","authors":"Santa Cruz, Alvin Lun-Knep, Jee, F. Ferguson, Kevin Karplus, T. Larrabee","doi":"10.1109/VTEST.1993.313302","DOIUrl":null,"url":null,"abstract":"Traditional fault models for testing CMOS VLSI circuits do not take into account the actual mechanisms that precipitate faults in CMOS circuits. As a result, tests based on traditional fault models may not detect all the faults that occur in the circuit. This paper discusses the Carafe software package which determines which faults are likely to occur in a circuit based on the circuit's physical design, defect parameters, and fabrication technology.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"187","resultStr":"{\"title\":\"Carafe: an inductive fault analysis tool for CMOS VLSI circuits\",\"authors\":\"Santa Cruz, Alvin Lun-Knep, Jee, F. Ferguson, Kevin Karplus, T. Larrabee\",\"doi\":\"10.1109/VTEST.1993.313302\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Traditional fault models for testing CMOS VLSI circuits do not take into account the actual mechanisms that precipitate faults in CMOS circuits. As a result, tests based on traditional fault models may not detect all the faults that occur in the circuit. This paper discusses the Carafe software package which determines which faults are likely to occur in a circuit based on the circuit's physical design, defect parameters, and fabrication technology.<<ETX>>\",\"PeriodicalId\":283218,\"journal\":{\"name\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"187\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1993.313302\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313302","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 187

摘要

用于测试CMOS VLSI电路的传统故障模型没有考虑到CMOS电路中沉淀故障的实际机制。因此，基于传统故障模型的测试可能无法检测到电路中发生的所有故障。本文讨论了Carafe软件包，该软件包可以根据电路的物理设计、缺陷参数和制造工艺来确定电路中可能发生的故障。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Carafe: an inductive fault analysis tool for CMOS VLSI circuits

Traditional fault models for testing CMOS VLSI circuits do not take into account the actual mechanisms that precipitate faults in CMOS circuits. As a result, tests based on traditional fault models may not detect all the faults that occur in the circuit. This paper discusses the Carafe software package which determines which faults are likely to occur in a circuit based on the circuit's physical design, defect parameters, and fabrication technology.<>

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Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium

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