{"title":"使用高质量因子的石英音叉的敲击和剪切模式原子力显微镜","authors":"V. T. Tùng, S. Chizhik, V. Chikunov, T. X. Hoai","doi":"10.1117/12.836902","DOIUrl":null,"url":null,"abstract":"A high-resolution atomic force microscopy using a quartz tuning fork in ambient conditions has been developed, which operates in two modes: tapping and shear modes. In our designs, a tungsten tip, with radius about 30-50nm, was attached to one prong of the tuning fork. Furthermore, a combination of the transducer and AFM NT-206 (Belarus) allows the assembly of system of tuning fork gluing tungsten tip to retain a high quality factor of up to 9000. These results lead to the possibility of commercial applications of a simple, user-friendly and advantage system for atomic force microscopy.","PeriodicalId":117315,"journal":{"name":"Nanodesign, Technology, and Computer Simulations","volume":"94 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Tapping and shear-mode atomic force microscopy using a quartz tuning fork with high quality factor\",\"authors\":\"V. T. Tùng, S. Chizhik, V. Chikunov, T. X. Hoai\",\"doi\":\"10.1117/12.836902\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A high-resolution atomic force microscopy using a quartz tuning fork in ambient conditions has been developed, which operates in two modes: tapping and shear modes. In our designs, a tungsten tip, with radius about 30-50nm, was attached to one prong of the tuning fork. Furthermore, a combination of the transducer and AFM NT-206 (Belarus) allows the assembly of system of tuning fork gluing tungsten tip to retain a high quality factor of up to 9000. These results lead to the possibility of commercial applications of a simple, user-friendly and advantage system for atomic force microscopy.\",\"PeriodicalId\":117315,\"journal\":{\"name\":\"Nanodesign, Technology, and Computer Simulations\",\"volume\":\"94 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nanodesign, Technology, and Computer Simulations\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.836902\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nanodesign, Technology, and Computer Simulations","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.836902","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Tapping and shear-mode atomic force microscopy using a quartz tuning fork with high quality factor
A high-resolution atomic force microscopy using a quartz tuning fork in ambient conditions has been developed, which operates in two modes: tapping and shear modes. In our designs, a tungsten tip, with radius about 30-50nm, was attached to one prong of the tuning fork. Furthermore, a combination of the transducer and AFM NT-206 (Belarus) allows the assembly of system of tuning fork gluing tungsten tip to retain a high quality factor of up to 9000. These results lead to the possibility of commercial applications of a simple, user-friendly and advantage system for atomic force microscopy.
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