超低泄漏静态随机存取存储器设计

Didigam Anitha, Mohd. Masood Ahmad
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引用次数: 0

摘要

提出了一种具有8个晶体管的超低漏静态随机存取存储器(SRAM)单元结构。与6T SRAM和其他现有的8T SRAM电池相比,该电池在保持模式下的泄漏功率显著降低。采用蝴蝶法和n曲线法计算了电池的稳定性参数。与6T SRAM相比,该SRAM具有更好的写余量和略小的读余量。该技术在保持模式下的功耗为790pw,与其他现有技术相比,功耗非常低。因此,所建议的单元适用于保持模式应用。采用gpdk45nm技术,利用Cadence (Virtuoso原理图和布局编辑器)工具进行仿真。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ultra-low leakage static random access memory design
An ultra-low leakage static random-access memory (SRAM) cell structure with 8 transistors is proposed in this paper. Compared to the 6T SRAM and other existing 8T SRAM cells, leakage power of the proposed cell in hold mode reduced significantly. The stability parameters of the proposed cell are calculated using butterfly method and also N-curve method. Proposed SRAM achieves better write margin with slightly less read margin than 6T SRAM. Proposed technique consumes 790 PW of power in hold mode, which is very less compared to other existing techniques. Therefore, the proposed cell is appropriate for hold mode applications. The simulations are carried out by using Cadence (Virtuoso Schematic and layout editor) tools with GPDK45-nm technology.
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