50℃等温时效后长时间贮存对QSAC10和QSAC20焊料高应变率力学性能的影响

P. Lall, M. Saha, J. Suhling
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引用次数: 0

摘要

在航空航天、军事、汽车、航天和石油勘探行业中,各种电子部件可能在高、低环境温度以及高应变率载荷下持续运行。这些部件也可以在部署前储存在非气候控制的外壳中。先前的研究表明,未掺杂的SAC合金在长时间的储存后,即使在中等温度下,材料性能也会发生变化。在SAC合金配方中引入了多种掺杂剂,以降低其时效效应。在本研究中,两种名为QSAC10和QSAC20的掺杂SAC焊料在50°C的温度下保存了30天,并进行了高应变率测试。对未时效样品和30天时效样品进行单轴拉伸试验,测量SAC+Bi焊料的力学性能。本实验使用的高、低工作温度范围为-65℃~ 200℃。然后利用实验材料数据计算了Anand粘塑性模型的常数,并将单轴拉伸试验的模型预测值与实验数据进行了比较。采用Anand本构模型,在有限元框架中实现了材料的本构行为。每个冲击事件的塑料功也被确定,这是焊接互连损伤进展的量度。最后,利用本构模型模拟了球栅阵列封装在印刷电路板上的冲击事件
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of Prolonged Storage on High strain rate Mechanical properties of QSAC10 and QSAC20 Solders after Exposure to Isothermal Aging of 50°C
In Aerospace, military, automotive, space and oil exploration industries, various electronic parts may be subjected to sustained operation at high and low surrounding temperatures as well as high strain-rate loads. These parts may also be stored in non-climate-controlled enclosures prior to deployment. Previous research studies have shown that material properties of undoped SAC alloys evolve even at moderate temperatures after a prolonged period of storage. A variety of dopants has been introduced into SAC alloy formulations in order to reduce the aging effects. In this study, two doped SAC solder called QSAC10 and QSAC20 has been subjected to high strain rate testing after keeping them in storage at temperature of 50°C for duration of 30 days. Samples with no aging and 30 days aged samples have been subjected to uniaxial tensile tests to measure the mechanical properties of SAC+Bi solders. The High and Low operating temperature used in this experiment ranged from -65°C to 200°C. Then the experimental material data has been used to compute the constants for the Anand Visco-Plasticity model and then the model predictions of the uniaxial tensile test has been compared with the experimental data. The material constitutive behavior has been implemented in a finite element framework to simulate the drop events using the Anand constitutive model. The plastic work per shock event has also been determined which is a measure of the damage progression in the solder interconnects. Lastly, the constitutive model has been used to simulate the shock event of a ball-grid array package on printed circuit board assembly
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