{"title":"IEEE 1641和ATML中的数字信号","authors":"C. Gorringe, Malcolm Brown, T. Lopes","doi":"10.1109/AUTEST.2009.5314018","DOIUrl":null,"url":null,"abstract":"The paper discusses the rational and benefits behind the recent MoD demonstration, using a fully compliant IEEE 1641 test system for both digital and analogue test programs, in line with the MoD ATS procurement policy.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Digital Signals in IEEE 1641 and ATML\",\"authors\":\"C. Gorringe, Malcolm Brown, T. Lopes\",\"doi\":\"10.1109/AUTEST.2009.5314018\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper discusses the rational and benefits behind the recent MoD demonstration, using a fully compliant IEEE 1641 test system for both digital and analogue test programs, in line with the MoD ATS procurement policy.\",\"PeriodicalId\":187421,\"journal\":{\"name\":\"2009 IEEE AUTOTESTCON\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2009.5314018\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The paper discusses the rational and benefits behind the recent MoD demonstration, using a fully compliant IEEE 1641 test system for both digital and analogue test programs, in line with the MoD ATS procurement policy.
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