{"title":"使用ASK反向散射调制的中频远场RFID读取范围限制","authors":"Nicolas Pillin, C. Dehollain, M. Declercq","doi":"10.1109/RME.2009.5201297","DOIUrl":null,"url":null,"abstract":"A model is proposed to describe the fundamental read range limitation due to the local oscillator phase noise in the reader, in IF-based, far-field RFID systems using amplitude-shift keying backscatter modulation. The relation between the system parameters (such as the data transfer rate) and the read range is discussed. The model is validated by measurements done on two different laboratory tag-reader systems.","PeriodicalId":245992,"journal":{"name":"2009 Ph.D. Research in Microelectronics and Electronics","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Read range limitation in IF-based far-field RFID using ASK backscatter modulation\",\"authors\":\"Nicolas Pillin, C. Dehollain, M. Declercq\",\"doi\":\"10.1109/RME.2009.5201297\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A model is proposed to describe the fundamental read range limitation due to the local oscillator phase noise in the reader, in IF-based, far-field RFID systems using amplitude-shift keying backscatter modulation. The relation between the system parameters (such as the data transfer rate) and the read range is discussed. The model is validated by measurements done on two different laboratory tag-reader systems.\",\"PeriodicalId\":245992,\"journal\":{\"name\":\"2009 Ph.D. Research in Microelectronics and Electronics\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 Ph.D. Research in Microelectronics and Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RME.2009.5201297\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Ph.D. Research in Microelectronics and Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RME.2009.5201297","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Read range limitation in IF-based far-field RFID using ASK backscatter modulation
A model is proposed to describe the fundamental read range limitation due to the local oscillator phase noise in the reader, in IF-based, far-field RFID systems using amplitude-shift keying backscatter modulation. The relation between the system parameters (such as the data transfer rate) and the read range is discussed. The model is validated by measurements done on two different laboratory tag-reader systems.
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