{"title":"2ghz FBAR压控振荡器中谐振器- qs缺陷的启动稳健性","authors":"K. B. Ostman, M. Valkama","doi":"10.1109/FCS.2012.6243615","DOIUrl":null,"url":null,"abstract":"The root locus (RL) method is used to analyze the start-up robustness of a two-stage dual-resonator high-Q VCO. The VCO includes a parallel LC tank and an above-IC FBAR (f<sub>s</sub> = 2.15 GHz, Q<sub>s</sub> = 515) that is prone to contact defects during above-IC post-processing. Results obtained after careful circuit modeling explain the VCO's start-up on f<sub>1</sub> before transitioning to and settling on the desired frequency f<sub>0</sub>. The RL approach is shown to be effective in obtaining the constraints on resonator Q<sub>s</sub> and revealing VCO failure modes. Only severe fabrication defects (Q<sub>s</sub> <; 100) inhibit proper start-up on f<sub>0</sub>.","PeriodicalId":256670,"journal":{"name":"2012 IEEE International Frequency Control Symposium Proceedings","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Start-up robustness against resonator-Qs defects in a 2-GHz FBAR VCO\",\"authors\":\"K. B. Ostman, M. Valkama\",\"doi\":\"10.1109/FCS.2012.6243615\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The root locus (RL) method is used to analyze the start-up robustness of a two-stage dual-resonator high-Q VCO. The VCO includes a parallel LC tank and an above-IC FBAR (f<sub>s</sub> = 2.15 GHz, Q<sub>s</sub> = 515) that is prone to contact defects during above-IC post-processing. Results obtained after careful circuit modeling explain the VCO's start-up on f<sub>1</sub> before transitioning to and settling on the desired frequency f<sub>0</sub>. The RL approach is shown to be effective in obtaining the constraints on resonator Q<sub>s</sub> and revealing VCO failure modes. Only severe fabrication defects (Q<sub>s</sub> <; 100) inhibit proper start-up on f<sub>0</sub>.\",\"PeriodicalId\":256670,\"journal\":{\"name\":\"2012 IEEE International Frequency Control Symposium Proceedings\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Frequency Control Symposium Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FCS.2012.6243615\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Frequency Control Symposium Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FCS.2012.6243615","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Start-up robustness against resonator-Qs defects in a 2-GHz FBAR VCO
The root locus (RL) method is used to analyze the start-up robustness of a two-stage dual-resonator high-Q VCO. The VCO includes a parallel LC tank and an above-IC FBAR (fs = 2.15 GHz, Qs = 515) that is prone to contact defects during above-IC post-processing. Results obtained after careful circuit modeling explain the VCO's start-up on f1 before transitioning to and settling on the desired frequency f0. The RL approach is shown to be effective in obtaining the constraints on resonator Qs and revealing VCO failure modes. Only severe fabrication defects (Qs <; 100) inhibit proper start-up on f0.
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