H. Uchida, K. Nishida, M. Osada, Funakubo, S. Koda
{"title":"稀土改性增强极化的铋基铁电薄膜","authors":"H. Uchida, K. Nishida, M. Osada, Funakubo, S. Koda","doi":"10.1109/ISAF.2007.4393194","DOIUrl":null,"url":null,"abstract":"Thin films of Bi-based perovskite ferroelectrics BiFeO<sub>3</sub> is recently recognized as strong candidates for alternatives to toxic Pb-based ferroelectrics such as conventional Pb(Zr,Ti)O<sub>3</sub>. Authors fabricated BiFeO<sub>3</sub> thin films with excellent performance of ferroelectric polarization by ion modification based on sol-gel technique. Some rare-earth ions, such as La<sup>3+</sup> or Nd<sup>3+</sup>, could be substituted for Bi<sup>3+</sup> ion in BFO crystal in order to reduce ionic defects in crystal lattices. Electrical resistivity of BiFeO<sub>3</sub> films were improved by ion modification of rare-earth elements, as well as other Bi-based ferroelectric films like Bi<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub>. Although crystal anisotropy and phase-transition temperature (Curie temperature) of these materials are generally reduced by the ion modification, it yield fully-saturated polarization (P) -electrical field (E) property to produce enhanced remanent polarization of approximately 50 muC/cm comparable or superior to conventional Pb(Zr,Ti)O<sub>3</sub> films. We concluded that the ion modification using rare-earth elements could suppress the ionic defects that caused electrical conduction in BiFeO<sub>3</sub> films.","PeriodicalId":321007,"journal":{"name":"2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Bi-based ferroelectric thin films with enhanced polarization by rare-earth modification\",\"authors\":\"H. Uchida, K. Nishida, M. Osada, Funakubo, S. Koda\",\"doi\":\"10.1109/ISAF.2007.4393194\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thin films of Bi-based perovskite ferroelectrics BiFeO<sub>3</sub> is recently recognized as strong candidates for alternatives to toxic Pb-based ferroelectrics such as conventional Pb(Zr,Ti)O<sub>3</sub>. Authors fabricated BiFeO<sub>3</sub> thin films with excellent performance of ferroelectric polarization by ion modification based on sol-gel technique. Some rare-earth ions, such as La<sup>3+</sup> or Nd<sup>3+</sup>, could be substituted for Bi<sup>3+</sup> ion in BFO crystal in order to reduce ionic defects in crystal lattices. Electrical resistivity of BiFeO<sub>3</sub> films were improved by ion modification of rare-earth elements, as well as other Bi-based ferroelectric films like Bi<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub>. Although crystal anisotropy and phase-transition temperature (Curie temperature) of these materials are generally reduced by the ion modification, it yield fully-saturated polarization (P) -electrical field (E) property to produce enhanced remanent polarization of approximately 50 muC/cm comparable or superior to conventional Pb(Zr,Ti)O<sub>3</sub> films. We concluded that the ion modification using rare-earth elements could suppress the ionic defects that caused electrical conduction in BiFeO<sub>3</sub> films.\",\"PeriodicalId\":321007,\"journal\":{\"name\":\"2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.2007.4393194\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2007.4393194","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Bi-based ferroelectric thin films with enhanced polarization by rare-earth modification
Thin films of Bi-based perovskite ferroelectrics BiFeO3 is recently recognized as strong candidates for alternatives to toxic Pb-based ferroelectrics such as conventional Pb(Zr,Ti)O3. Authors fabricated BiFeO3 thin films with excellent performance of ferroelectric polarization by ion modification based on sol-gel technique. Some rare-earth ions, such as La3+ or Nd3+, could be substituted for Bi3+ ion in BFO crystal in order to reduce ionic defects in crystal lattices. Electrical resistivity of BiFeO3 films were improved by ion modification of rare-earth elements, as well as other Bi-based ferroelectric films like Bi4Ti3O12. Although crystal anisotropy and phase-transition temperature (Curie temperature) of these materials are generally reduced by the ion modification, it yield fully-saturated polarization (P) -electrical field (E) property to produce enhanced remanent polarization of approximately 50 muC/cm comparable or superior to conventional Pb(Zr,Ti)O3 films. We concluded that the ion modification using rare-earth elements could suppress the ionic defects that caused electrical conduction in BiFeO3 films.