Stefan Lange, Gao Yiding, S. Krause, A. Hähnel, V. Naumann, C. Hagendorf
{"title":"金属/TCO结界面氧化物和基于选择性激光烧蚀的微传递长度测量超低接触电阻率测定","authors":"Stefan Lange, Gao Yiding, S. Krause, A. Hähnel, V. Naumann, C. Hagendorf","doi":"10.1063/5.0090007","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":403678,"journal":{"name":"SiliconPV 2021, The 11th International Conference on Crystalline Silicon Photovoltaics","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Interfacial oxides at metal/TCO junctions and ultra-low contact resistivity determination by micro transfer length measurements based on selective laser ablation\",\"authors\":\"Stefan Lange, Gao Yiding, S. Krause, A. Hähnel, V. Naumann, C. Hagendorf\",\"doi\":\"10.1063/5.0090007\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":403678,\"journal\":{\"name\":\"SiliconPV 2021, The 11th International Conference on Crystalline Silicon Photovoltaics\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"SiliconPV 2021, The 11th International Conference on Crystalline Silicon Photovoltaics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1063/5.0090007\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"SiliconPV 2021, The 11th International Conference on Crystalline Silicon Photovoltaics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/5.0090007","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Interfacial oxides at metal/TCO junctions and ultra-low contact resistivity determination by micro transfer length measurements based on selective laser ablation