气相-固相沉积Bi2Se3薄膜热电性能的结构决定

J. Andzane, K. Buks, M. Zubkins, M. Bechelany, M. Marnauza, M. Baitimirova, D. Erts
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引用次数: 3

摘要

在这项工作中,采用一种简单的无催化剂气相-固体沉积方法,在不同的(熔融石英/玻璃,云母,石墨烯)衬底上控制获得两种类型(平面和无序)连续的Bi2Se3纳米结构薄膜。对沉积薄膜的输运和热电特性(主要载流子的类型、浓度和迁移率、塞贝克系数和功率因数)进行的研究表明,所提出的沉积方法可以制备“低掺杂”Bi2Se3薄膜,其功率因数与用分子束外延技术制备的Bi2Se3薄膜相当,甚至更高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Structure-determined thermoelectric properties of Bi2Se3 thin films deposited by vapour-solid technique
In this work, a simple catalyst-free vapour-solid deposition method is applied for controlled obtaining of two types (planar and disordered) continuous Bi2Se3 nanostructured thin films on different (fused quartz/glass, mica, graphene) substrates. Performed for the deposited thin films transport and thermoelectric characterization (type, concentration and mobility of the main charge carriers, Seebeck coefficient and power factor) showed that proposed deposition method allows to fabricate “low-doped” Bi2Se3 thin films with power factor comparable and even higher than reported for the Bi2Se3 thin films fabricated by molecular beam epitaxy technique.
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