记忆测试仪在快闪记忆装置微裂纹及裂纹模式无损检测中的应用

Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003 Pub Date : 2003-07-07 DOI:10.1109/IPFA.2003.1222743

S. Phurikhup, S. Pruettipongsapuk, K. Sirivathanant

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引用次数: 0

摘要

本文介绍了一种利用记忆测试仪对模具裂纹和裂纹模式进行无损检测的新技术。该技术的概念是基于这样一个事实，即几乎90%的存储设备的空间是由细胞存储器组成的，因此，如果微裂纹存在，这种现象将导致存储器的故障。

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Application of memory tester for non-destructive detection of micro-crack and crack patterns in flash memory devices

In this paper, we introduces a new , non-destructive inspection technique for die crack and crack pattern using a memory tester. The concept of the technique is based upon the fact that almost ninety percent of the space of a memory device consists of cell memories, thus if microcrack is present, the phenomenon would cause malfunctioning of the memory.

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Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003

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