{"title":"基于聚焦叠加的变焦透镜表面轮廓测量","authors":"Chen-Liang Fan, C. Weng, Yu-Hsin Lin, P. Cheng","doi":"10.1109/I2MTC.2018.8409820","DOIUrl":null,"url":null,"abstract":"In this study, we developed a 3D surface profiling technique based on a varifocal lens and focus-stacking method that uses a high-pass filter in conjunction with a focus algorithm. The varifocal lens was used in conjunction with a CCD camera to capture images of samples from various distances. The focus stacking method was then used to construct a surface profile and the image with large depth-of-filed.","PeriodicalId":393766,"journal":{"name":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Surface profiling measurement using varifocal lens based on focus stacking\",\"authors\":\"Chen-Liang Fan, C. Weng, Yu-Hsin Lin, P. Cheng\",\"doi\":\"10.1109/I2MTC.2018.8409820\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, we developed a 3D surface profiling technique based on a varifocal lens and focus-stacking method that uses a high-pass filter in conjunction with a focus algorithm. The varifocal lens was used in conjunction with a CCD camera to capture images of samples from various distances. The focus stacking method was then used to construct a surface profile and the image with large depth-of-filed.\",\"PeriodicalId\":393766,\"journal\":{\"name\":\"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)\",\"volume\":\"2016 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/I2MTC.2018.8409820\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/I2MTC.2018.8409820","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Surface profiling measurement using varifocal lens based on focus stacking
In this study, we developed a 3D surface profiling technique based on a varifocal lens and focus-stacking method that uses a high-pass filter in conjunction with a focus algorithm. The varifocal lens was used in conjunction with a CCD camera to capture images of samples from various distances. The focus stacking method was then used to construct a surface profile and the image with large depth-of-filed.