{"title":"平面上像素采样和场景离散化的视点依赖信息理论质量度量","authors":"Jaume Rigau, M. Feixas, M. Sbert, P. Bekaert","doi":"10.1109/SCCG.2001.945352","DOIUrl":null,"url":null,"abstract":"In this paper, we present view-dependent information theory quality measures for pixel sampling and scene discretization in flatland. The measures are based on a definition for the mutual information of a line, and have a purely geometrical basis. Several algorithms exploiting them are presented and compare well with an existing one based on depth differences.","PeriodicalId":331436,"journal":{"name":"Proceedings Spring Conference on Computer Graphics","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"View-dependent information theory quality measures for pixel sampling and scene discretization in flatland\",\"authors\":\"Jaume Rigau, M. Feixas, M. Sbert, P. Bekaert\",\"doi\":\"10.1109/SCCG.2001.945352\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present view-dependent information theory quality measures for pixel sampling and scene discretization in flatland. The measures are based on a definition for the mutual information of a line, and have a purely geometrical basis. Several algorithms exploiting them are presented and compare well with an existing one based on depth differences.\",\"PeriodicalId\":331436,\"journal\":{\"name\":\"Proceedings Spring Conference on Computer Graphics\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-04-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Spring Conference on Computer Graphics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SCCG.2001.945352\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Spring Conference on Computer Graphics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SCCG.2001.945352","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
View-dependent information theory quality measures for pixel sampling and scene discretization in flatland
In this paper, we present view-dependent information theory quality measures for pixel sampling and scene discretization in flatland. The measures are based on a definition for the mutual information of a line, and have a purely geometrical basis. Several algorithms exploiting them are presented and compare well with an existing one based on depth differences.