ESD中集成通信接口的功能分析

2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) Pub Date : 2015-12-17 DOI:10.1109/EMCCOMPO.2015.7358343

Thomas Ungru, W. Wilkening, Steffen Walker, R. Negra

{"title":"ESD中集成通信接口的功能分析","authors":"Thomas Ungru, W. Wilkening, Steffen Walker, R. Negra","doi":"10.1109/EMCCOMPO.2015.7358343","DOIUrl":null,"url":null,"abstract":"This paper presents the analysis of effects and consequences of ESD on an operating integrated communication interface. We used a test structure for a differential bus module and observed its output signal behaviour under conducted ESD gun stress, to our knowledge for the first time. Measurements correlate to our simulations.","PeriodicalId":236992,"journal":{"name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Functional analysis of an integrated communication interface during ESD\",\"authors\":\"Thomas Ungru, W. Wilkening, Steffen Walker, R. Negra\",\"doi\":\"10.1109/EMCCOMPO.2015.7358343\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the analysis of effects and consequences of ESD on an operating integrated communication interface. We used a test structure for a differential bus module and observed its output signal behaviour under conducted ESD gun stress, to our knowledge for the first time. Measurements correlate to our simulations.\",\"PeriodicalId\":236992,\"journal\":{\"name\":\"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCOMPO.2015.7358343\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2015.7358343","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

本文分析了静电放电对集成通信接口的影响和后果。我们使用了差分总线模块的测试结构，并首次观察了其在传导ESD枪应力下的输出信号行为。测量结果与我们的模拟相关联。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Functional analysis of an integrated communication interface during ESD

This paper presents the analysis of effects and consequences of ESD on an operating integrated communication interface. We used a test structure for a differential bus module and observed its output signal behaviour under conducted ESD gun stress, to our knowledge for the first time. Measurements correlate to our simulations.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

自引率

0.00%

发文量