{"title":"ESD损伤阈值:历史与预后[磁头]","authors":"B. Perry","doi":"10.1109/EOSESD.2000.890091","DOIUrl":null,"url":null,"abstract":"ESD damage thresholds have been declining almost monotonically ever since we started to use MR heads. This work explains that this trend is the result of heat flow, and demonstrates by theory and experiment that the damage threshold for human body model (HBM) transients is roughly proportional to read width.","PeriodicalId":332394,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2000-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"ESD damage thresholds: history and prognosis [magnetic heads]\",\"authors\":\"B. Perry\",\"doi\":\"10.1109/EOSESD.2000.890091\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"ESD damage thresholds have been declining almost monotonically ever since we started to use MR heads. This work explains that this trend is the result of heat flow, and demonstrates by theory and experiment that the damage threshold for human body model (HBM) transients is roughly proportional to read width.\",\"PeriodicalId\":332394,\"journal\":{\"name\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EOSESD.2000.890091\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2000.890091","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
ESD damage thresholds: history and prognosis [magnetic heads]
ESD damage thresholds have been declining almost monotonically ever since we started to use MR heads. This work explains that this trend is the result of heat flow, and demonstrates by theory and experiment that the damage threshold for human body model (HBM) transients is roughly proportional to read width.